Promising characteristics of GaN layers grown on amorphous silica substrates by gas-source MBE

被引:25
|
作者
Iwata, K
Asahi, H
Asami, K
Ishida, A
Kuroiwa, R
Tampo, H
Gonda, S
Chichibu, S
机构
[1] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 567, Japan
[2] Sci Univ Tokyo, Fac Sci & Technol, Noda, Chiba 278, Japan
基金
日本学术振兴会;
关键词
GaN; polycrystal; glass substrate; gas source MBE; PL; PLE; stokes shift;
D O I
10.1016/S0022-0248(98)00229-2
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Polycrystalline GaN layers are grown on amorphous fused silica glass substrates by gas-source MBE using ion removed electron cyclotron resonance (ECR) radical cell. Polycrystalline GaN grown here shows a strong photoluminescence without deep-level emission. The emission peak with a wide spectral half-width is red-shifted from the excitonic emission of a GaN layer grown on a sapphire substrate. The peak is excitonic from the excitation power and temperature dependencies of the PL spectrum. Photoluminescence excitation spectra show that the polycrystalline GaN has a large Stokes shift. The results suggest that the polycrystalline GaN has a large potential fluctuation due to a grain to grain potential distribution and that the strong emission originates from the lower-energy tail of the absorption spectrum, Such optical properties indicate that the polycrystalline GaN layers grown on the glass substrates are promising to fabricate large area and low cast light-emitting devices and solar cells. Polycrystalline optical device technology will be indispensable for industrial applications as well as the polycrystalline and the amorphous Si devices. (C) 1998 Elsevier Science B.V, All rights reserved.
引用
收藏
页码:218 / 222
页数:5
相关论文
共 50 条
  • [21] SURFACE-MORPHOLOGY OF GAAS GROWN BY GAS-SOURCE MBE USING TRIMETHYLGALLIUM AND ARSENIC
    ISHIKAWA, H
    KONDO, K
    SASA, S
    TANAKA, H
    HIYAMIZU, S
    JOURNAL OF CRYSTAL GROWTH, 1986, 76 (02) : 521 - 524
  • [22] Infrared reflection in the Reststrahlen region of GaN MBE grown epitaxial layers on Si substrates
    Institute of Vacuum Technology, Ul. Dluga 44/50, 00-241, Warszawa, Poland
    不详
    Diamond Relat. Mat., 1 (25-28):
  • [23] Infrared reflection in the Reststrahlen region of GaN MBE grown epitaxial layers on Si substrates
    Iller, A
    Jantsch, W
    Marks, J
    Pastuszka, B
    Diduszko, R
    Sadowski, J
    DIAMOND AND RELATED MATERIALS, 1999, 8 (01) : 25 - 28
  • [24] Reflectance and electroreflectance of MBE grown GaN layers
    Shokhovets, SV
    Goldhahn, R
    Gobsch, G
    Cheng, TS
    Foxon, CT
    PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES: REVIEW AND SHORT NOTES TO NANOMEETING '97, 1997, : 87 - 90
  • [25] Microstructures of GaN1-xPx layers grown on (0001)GaN substrates by gas source molecular beam epitaxy
    Seong, TY
    Bae, IT
    Choi, CJ
    Noh, DY
    Zhao, Y
    Tu, CW
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (06) : 3192 - 3197
  • [26] Study of Be diffusion in InGaAsP layers grown by gas-source molecular beam epitaxy
    LEMI-IUT Universite de Rouen, Mont Saint Aignan, France
    J Phys D, 24 (3421-3427):
  • [27] EFFECTS OF RAPID THERMAL ANNEALING ON INP LAYERS GROWN ON GAAS SUBSTRATES BY GAS-SOURCE MOLECULAR-BEAM EPITAXY
    RIESZ, F
    RAKENNUS, K
    HAKKARAINEN, T
    PESSA, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (01): : 176 - 177
  • [28] Optical study of GaAs1-xSbx layers grown on GaAs substrates by gas-source molecular beam epitaxy
    Hsu, H. P.
    Huang, J. K.
    Huang, Y. S.
    Lin, Y. T.
    Lin, H. H.
    Tiong, K. K.
    MATERIALS CHEMISTRY AND PHYSICS, 2010, 124 (01) : 558 - 562
  • [29] Highly strained photovoltaic dual-channel intersubband photodetectors grown by gas-source MBE
    Elagin, Mikaela
    Schulz, P.
    Elagin, Mstislav
    Semtsiv, M. P.
    Kirmse, H.
    Mogilatenko, A.
    Masselink, W. T.
    JOURNAL OF CRYSTAL GROWTH, 2013, 378 : 607 - 610
  • [30] A study of Be diffusion in InGaAsP layers grown by gas-source molecular beam epitaxy
    Koumetz, S
    Ketata, K
    Ketata, M
    Marcon, J
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1998, 31 (24) : 3421 - 3427