Advanced electron microscopy for thermoelectric materials

Thermoelectric (TE) materials can interconvert waste heat into electricity, thus are promising for power generation and solid-state refrigeration. The thermoelectric properties of a certain material strongly correlate with its chemical, structural and electronic features; therefore, a thorough characterization of these features is not only crucial to profoundly understand the material itself, but also helps to design new materials with desired properties. Under this circumstance, various electron microscopy (EM) techniques are developed, from micro-scale to atomic-scale, two-dimensional (2-D) to 3-D, and static to dynamic. In this review, we review advanced EM techniques already applied in and also look into the perspective of introducing more EM techniques into the field of thermo-electrics. Specifically, we firstly summarize "what have been done" involving: structural and chemical characterizations of all-scale "imperfectness", electronic structure investigation, 3-D morphology and dynamic evolution of nanostructures, and atomic-scale mapping of Seebeck coefficient and defects; based on these characterized features, we then briefly review the calculations on electrical and thermal transport properties to illustrate the structure-property correlations. In what follows, we propose "what can be done" in TEs via EM techniques including: valence-electron distribution, quantitative measurement of atomic displacement, point defect characterization, local band gap measurement, phonon excitation detection, electrostatic potential determination, thermal stability of nanostructures, and in-situ observation and measurement of local TE effects. (C) 2015 Elsevier Ltd. All rights reserved.