Growth of β-FeSi2 thin films on silicon (100) substrate for different annealing times by pulsed laser deposition

被引:3
作者
Xu, S. C. [1 ]
Gao, S. B. [1 ]
Man, B. Y. [1 ]
Yang, C. [1 ]
Liu, M. [1 ]
Ma, Y. Y. [1 ]
Jiang, S. Z. [1 ]
Chen, C. S. [1 ]
Liu, A. H. [1 ]
Gao, X. G. [1 ]
Sun, Z. C. [1 ]
Hu, B. [1 ]
Wang, C. C. [1 ]
机构
[1] Shandong Normal Univ, Coll Phys & Elect, Jinan 250014, Peoples R China
关键词
beta-FeSi2; Thermal annealing; Photoluminescence; OPTICAL CHARACTERIZATION; PHOTOLUMINESCENCE; ANISOTROPY; DROPLETS; SI;
D O I
10.1016/j.vacuum.2011.12.019
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Single-phase beta-FeSi2 films were fabricated on silicon (100) substrates by pulsed laser deposition (PLO) technique and post-annealing process. The X-ray diffraction (XRD) showed that the diffraction intensity reached a certain threshold and then decreased with the increase of annealing time. The scanning electron microscopy (SEM) observations revealed surface morphologies of the films for different annealing times. The optimal photoluminescence (PL) of the films was obtained after 9 h annealing process. Based upon all the experimental results, it was found that the luminous properties were associated with the crystalline quality and surface morphologies. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1007 / 1011
页数:5
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