Extended X-ray Absorption Fine Structure and X-ray Diffraction Examination of Sputtered Nickel Carbon Binary Thin Films for Fuel Cell Applications

被引:9
作者
Ingham, Bridget [1 ,2 ]
Gaston, Nicola [1 ,2 ]
Fahy, Kieran [3 ]
Chin, Xiao Yao [3 ]
Dotzler, Christian J. [1 ]
Rees, Eric [3 ]
Haslam, Gareth [3 ]
Barber, Zoe H. [3 ]
Burstein, G. Timothy [3 ]
Ryan, Mary P. [4 ,5 ]
机构
[1] Ind Res Ltd, Lower Hutt 5011, New Zealand
[2] Victoria Univ Wellington, MacDiarmid Inst Adv Mat & Nanotechnol, Sch Chem & Phys Sci, Wellington 6140, New Zealand
[3] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
[4] Univ London Imperial Coll Sci Technol & Med, Dept Mat, London SW7 2AZ, England
[5] Univ London Imperial Coll Sci Technol & Med, London Ctr Nanotechnol, London SW7 2AZ, England
基金
英国工程与自然科学研究理事会;
关键词
INITIO MOLECULAR-DYNAMICS; TOTAL-ENERGY CALCULATIONS; CARBIDE-MODIFIED MO(110); WAVE BASIS-SET; TUNGSTEN CARBIDE; POTENTIAL APPLICATION; METHANOL ELECTROOXIDATION; ELECTROCATALYTIC ACTIVITY; SURFACE REACTIVITIES; REACTION PATHWAYS;
D O I
10.1021/jp207308g
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Extended X-ray absorption fine structure (EXAFS) and X-ray diffraction (XRD) are used to study the structure of sputtered binary nickel carbon alloy films (5-44 atom % Ni) for use as potential electrocatalysts in acidic solutions. Three compositional regions are identified: "low" (5 atom % Ni), where the structure consists mainly of isolated Ni atoms or dimers in a carbon matrix; "medium" (11-24 atom % Ni), where the Ni-Ni nearest-neighbor coordination is increased but there is little longer-range order; and "high" (35-44 atom % Ni), where crystalline Ni3C is formed. This indicates a threshold concentration of Ni of between 25 and 35 at% before Ni3C starts to form.
引用
收藏
页码:6159 / 6165
页数:7
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