RFCMOS ESD protection and reliability

被引：13

作者：

Natarajan, MI ^{[1
]}

Linten, D ^{[1
]}

Thijs, S ^{[1
]}

Jansen, P ^{[1
]}

Trémouilles, D ^{[1
]}

Jeamsaksiri, W ^{[1
]}

Nakaie, T ^{[1
]}

Sawada, M ^{[1
]}

Hasebe, T ^{[1
]}

Decoutere, S ^{[1
]}

Groeseneken, G ^{[1
]}

机构：

[1] IMEC vzw, B-3001 Louvain, Belgium

来源：

IPFA 2005: PROCEEDINGS OF THE 12TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS | 2005年

关键词：

D O I：

10.1109/IPFA.2005.1469132

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：59 / 66

页数：8

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