Keith Tester: In memory

被引：0
作者：
Carroll, John [1 ]
机构：
[1] La Trobe Univ, Bundoora, Vic, Australia
来源：
THESIS ELEVEN | 2020年 / 158卷 / 01期
关键词：
D O I：
10.1177/0725513620928796
中图分类号：
C91 [社会学];
学科分类号：
030301 ; 1204 ;
摘要：
引用
收藏
页码：17 / 18
页数：2
相关论文
共 50 条
[31]   High speed and high density test vectors memory for a LSI tester [J].
Olariu, A., 1600, (34)
[32]   Experiencing tradition: Essays of discovery. In memory of Keith Spalding (1913-2002) [J].
Ritchie, JM .
MODERN LANGUAGE REVIEW, 2004, 99 :846-847
[33]   An FPCA-based re-configurable functional tester for memory chips [J].
Huang, JR ;
Ong, CK ;
Cheng, KT ;
Wu, CW .
PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000), 2000, :51-57
[34]   CRT - MEMORY-TESTER SYSTEM TRACKS DOWN FAILURE BITS IN COLOR [J].
YENCHARIS, L .
ELECTRONIC DESIGN, 1979, 27 (08) :28-29
[35]   Vector memory expansion system for T33xx logic tester [J].
Yamada, K ;
Takahashi, Y .
PROCEEDINGS OF THE 11TH ASIAN TEST SYMPOSIUM (ATS 02), 2002, :392-396
[36]   Keith Coventry [J].
Applin, Jo .
ARTFORUM INTERNATIONAL, 2013, 51 (05) :218-218
[37]   Kit Keith [J].
Watkin, M .
ART IN AMERICA, 2003, 91 (10) :143-143
[38]   HARING,KEITH [J].
KUSPIT, D .
ARTFORUM, 1986, 24 (06) :102-103
[39]   YOUNG,KEITH [J].
LEWIS, J .
DANCE MAGAZINE, 1986, 60 (10) :25-26
[40]   HARING,KEITH [J].
STELLWEG, C .
ARTNEWS, 1983, 82 (01) :145-146
12345