Depth magnetization profile of a perpendicular exchange coupled system by soft-x-ray resonant magnetic reflectivity

被引：44
作者：
Tonnerre, J. M. [1 ]
De Santis, M. [1 ]
Grenier, S. [1 ]
Tolentino, H. C. N. [1 ]
Langlais, V. [1 ,2 ]
Bontempi, E. [3 ]
Garcia-Fernandez, M. [4 ]
Staub, U. [4 ]
机构：
[1] CNRS, Inst Neel, F-38042 Grenoble 9, France
[2] Univ Autonoma Barcelona, Dept Fis, E-08193 Barcelona, Spain
[3] Univ Brescia, Chim Tech Lab, I-25123 Brescia, Italy
[4] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland
来源：
PHYSICAL REVIEW LETTERS | 2008年 / 100卷 / 15期
关键词：
D O I：
10.1103/PhysRevLett.100.157202
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The magnetic profile across the interface of a perpendicular exchange coupled [NiO/CoO](3)/Pt-Co/ Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign.
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页数：4
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