Gas-pressure assisted sintering of copper indium gallium selenide thin films

被引:4
作者
Wu, Yu-Chien [1 ]
Yang, Chang-Ting [1 ]
Sun, Manting [1 ]
Hsiang, Hsing-I [1 ]
机构
[1] Natl Cheng Kung Univ, Dept Resources Engn, Tainan, Taiwan
关键词
copper indium gallium selenide; gas-pressure assisted sintering; microstructure; non-vacuum process; ELECTRICAL-PROPERTIES; TEMPERATURE;
D O I
10.1111/jace.16216
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Defects, such as cracks, porous structure, small grains that easily occur in the fabrication of copper indium gallium selenide (CIGS) thin film absorbers using non-vacuum process have been the major obstacle to practical application of this technology so far. A gas-pressure assisted sintering process has been developed to achieve dense, crack-free, large-grained CIGS films. The gas-pressure assisted sintering effects on the microstructure, crystalline, and electric properties were investigated by scanning electron microscopy, X-ray diffraction, and Hall-effect analyzer. A uniform microstructure with a large grain size and small amount of isolated residual pores and good electric properties can be obtained by pre-sintering at 500 degrees C under 6bar N-2 overpressure and then annealing at 500 degrees C for 20minutes under a selenium atmosphere.
引用
收藏
页码:1548 / 1552
页数:5
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