Comparison of AZO, GZO, and AGZO Thin Films TCOs Applied for a-Si Solar Cells

被引:52
作者
Lin, Y. C. [1 ]
Chen, T. Y. [1 ]
Wang, L. C. [1 ]
Lien, S. Y. [2 ]
机构
[1] Natl Changhua Univ Educ, Dept Mechatron Engn, Changhua 50007, Taiwan
[2] MingDao Univ, Dept Mat Sci & Engn, Chunghua 52345, Taiwan
关键词
ZINC-OXIDE; OPTICAL-PROPERTIES; ELECTRODES; PERFORMANCE; LAYERS;
D O I
10.1149/2.108206jes
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
This study prepared aluminum and gallium co-doped zinc oxide (AGZO) thin films using pulsed direct current magnetron sputtering, and studied the electrical properties, transmittance, effects of texturing, and applicability as the front contact for a-Si:H solar cells. Textured ZnO:Al (AZO) and ZnO:Ga (GZO) thin films were also compared with AGZO thin film to evaluate their performance as front contacts. Experimental results show that AGZO films with the highest figure of merit phi TC value (24.64 x 10(-3) Omega(-1)) were obtained at Al and Ga doping concentrations of 0.54 wt% and 1.165 wt%, respectively. The textured AGZO films used as the front contact in a-Si:H solar cells achieved the following results: V-OC = 0.77 V, JSC = 16.5 mA/cm(2), FF = 59%, and conversion efficiency of 7.53%. AZO and GZO films have better electrical properties than AGZO film; however, AGZO film has superior transmittance in the near-infrared (NIR) region and higher JSC, conversion efficiency and external quantum efficiency (EQE) than AZO and GZO films under a similar haze value. (C) 2012 The Electrochemical Society. [DOI: 10.1149/2.108206jes] All rights reserved.
引用
收藏
页码:H599 / H604
页数:6
相关论文
共 28 条
  • [1] Bagley B.G., 1974, Amorphous and liquid semiconductors
  • [2] Characterization of transparent conducting oxides
    Coutts, TJ
    Young, DL
    Li, XN
    [J]. MRS BULLETIN, 2000, 25 (08) : 58 - 65
  • [3] Surface textured ZnO films for thin film solar cell applications by expanding thermal plasma CVD
    Groenen, R
    Löffler, J
    Sommeling, PM
    Linden, JL
    Hamers, EAG
    Schropp, REI
    van de Sanden, MCM
    [J]. THIN SOLID FILMS, 2001, 392 (02) : 226 - 230
  • [4] NEW FIGURE OF MERIT FOR TRANSPARENT CONDUCTORS
    HAACKE, G
    [J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (09) : 4086 - 4089
  • [5] BAND-GAP WIDENING IN HEAVILY SN-DOPED IN2O3
    HAMBERG, I
    GRANQVIST, CG
    BERGGREN, KF
    SERNELIUS, BE
    ENGSTROM, L
    [J]. PHYSICAL REVIEW B, 1984, 30 (06): : 3240 - 3249
  • [6] Material study on reactively sputtered zinc oxide for thin film silicon solar cells
    Hüpkes, J
    Rech, B
    Calnan, S
    Kluth, O
    Zastrow, U
    Siekmann, H
    Wuttig, M
    [J]. THIN SOLID FILMS, 2006, 502 (1-2) : 286 - 291
  • [7] OPTICAL-PROPERTIES OF SPUTTER-DEPOSITED ZNO-AL THIN-FILMS
    JIN, ZC
    HAMBERG, I
    GRANQVIST, CG
    [J]. JOURNAL OF APPLIED PHYSICS, 1988, 64 (10) : 5117 - 5131
  • [8] The annealing effect on damp heat stability of AGZO thin films prepared by DC moving magnetron sputtering
    Kang, Jong-Ho
    Lee, Myung-Hyun
    Kim, Dae Wook
    Lim, Young Soo
    Seo, Won-Seon
    Choi, Heon-Jin
    [J]. CURRENT APPLIED PHYSICS, 2011, 11 (03) : S333 - S336
  • [9] Electrical Resistivity and Transmittance Properties of Al- and Ga-codoped ZnO Thin Films
    Kang, Jungwoo
    Kim, Hyoun Woo
    Lee, Chongmu
    [J]. JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2010, 56 (02) : 576 - 579
  • [10] Growth and characterization of Ga-doped ZnO layers on a-plane sapphire substrates grown by molecular beam epitaxy
    Kato, H
    Sano, M
    Miyamoto, K
    Yao, T
    [J]. JOURNAL OF CRYSTAL GROWTH, 2002, 237 : 538 - 543