Monitoring microstructural evolution in-situ during cyclic deformation by high resolution reciprocal space mapping

被引：2

作者：

Diederichs, Annika M. ^{[1
]}

Thiel, Felix ^{[1
,2
]}

Fischer, Torben ^{[3
]}

Lienert, Ulrich ^{[4
]}

Pantleon, Wolfgang ^{[1
]}

机构：

[1] Tech Univ Denmark, Dept Mech Engn Mat & Surface Engn, DK-2800 Lyngby, Denmark

[2] Leibniz Inst Solid State & Mat Res, Inst Metall Mat, D-01690 Dresden, Germany

[3] Helmholtz Zentrum Geesthacht, Inst Mat Res, D-21502 Geesthacht, Germany

[4] DESY, Photon Sci, D-22607 Hamburg, Germany

来源：

6TH INTERNATIONAL CONFERENCE ON FRACTURE FATIGUE AND WEAR (FFW) | 2017年 / 843卷

关键词：

ALUMINUM SINGLE-CRYSTALS; STRAIN PATH CHANGE; X-RAY-DIFFRACTION; DISLOCATION-STRUCTURES; CRYSTALLOGRAPHIC ORIENTATION; PLASTIC-DEFORMATION; INDIVIDUAL GRAINS; FATIGUE; ARRANGEMENTS; BEHAVIOR;

D O I：

10.1088/1742-6596/843/1/012031

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

The recently developed synchrotron technique High Resolution Reciprocal Space Mapping (HRRSM) is used to characterize the deformation structures evolving during cyclic deformation of commercially pure, polycrystalline aluminium AA1050. Insight into the structural reorganization within single grains is gained by in-situ monitoring of the microstructural evolution during cyclic deformation. By HRRSM, a large number of individual subgrains can be resolved within individual grains in the bulk of polycrystalline specimens and their fate, their individual orientation and elastic stresses, tracked during different loading regimes as tension and compression. With this technique, the evolution of dislocation structures in selected grains was followed during an individual load cycle.

引用

页数：9

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