Asymmetric Bragg reflection as x-ray magnifier

被引:0
作者
Schäfer, P [1 ]
Köhler, R [1 ]
机构
[1] Humboldt Univ, Inst Phys, D-10115 Berlin, Germany
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中图分类号
O59 [应用物理学];
学科分类号
摘要
Often detector resolution limits the spatial resolution of x-ray imaging close to I pm. Image magnification is one of the solutions of this problem. Among several approaches magnification by asymmetric Bragg reflection is a promising way to achieve magnification around or above a factor of 100. This technique is well known for many years but not yet established. Therefore this paper will discuss the implications regarding experimental set-up, resolution and efficiency. This will be done mainly from the experimental point of view by means of experiments which were done at the beamline ID11 of the European synchrotron radiation facility. It is shown that submicrometre resolution can be achieved at high magnification in two dimensions. This even holds in case of objects with low contrast. The technique is well suited for an energy range around 10 keV at highly brilliant sources. Some effects related with beam optics, Fresnel and Bragg reflection are observed, which might be critical for further image evaluation.
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页码:A113 / A117
页数:5
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