Electromagnetic Transients Simulation-Based Surrogate Models for Tolerance Analysis of FACTS Apparatus

被引:7
作者
Heidari, Maziar [1 ]
Filizadeh, Shaahin [2 ]
Gole, Aniruddha M. [2 ]
机构
[1] Teshmont Consultants, Winnipeg, MB R3T 0P4, Canada
[2] Univ Manitoba, Dept Elect & Comp Engn, Winnipeg, MB R3T 5V6, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
Selective harmonic elimination (SHE); static compensator (STATCOM); tolerance analysis electromagnetic transient (EMT) simulation; uncertainty analysis; ALGORITHMS; UNCERTAINTY; CIRCUIT; SYSTEM; TOOLS;
D O I
10.1109/TPWRD.2013.2244618
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper introduces a computationally efficient surrogate model-based approach for tolerance analysis of power systems. Surrogate models are heuristic, simple representations of complex systems that are obtained through an automated sensitivity analysis of electromagnetic transient simulations results. These simpler models are shown in this paper to be significantly faster than full-detail simulation models to obtain accurate statistical tolerance information about complex power networks. Usefulness of the proposed approach is demonstrated by two application examples. In the first example, surrogate models are used for determining the statistical distribution of undesired remnant harmonics produced by a voltage-source converter, given the uncertainty in the firing angles. In the second example, the impact of variations in the system parameters around the nominal values on the transient behavior of a static compensator is analyzed.
引用
收藏
页码:797 / 806
页数:10
相关论文
共 28 条
[1]   A complete solution to the harmonic elimination problem [J].
Chiasson, JN ;
Tolbert, LM ;
McKenzie, KJ ;
Du, Z .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2004, 19 (02) :491-499
[2]  
De Vivo B, 2003, PROCEEDINGS OF THE 2003 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL IV, P576
[3]  
DOMMEL HW, 1969, IEEE T POWER AP SYST, VPA88, P388, DOI 10.1109/TPAS.1969.292459
[4]   True worst-case circuit tolerance analysis using genetic algorithms and affine arithmetic [J].
Femia, Nicola, 2000, IEEE, Piscataway, NJ, United States (47)
[5]   Large-scale tolerance analysis [J].
Fimmel, D ;
Quitzk, S ;
Schwarz, W .
INTERNATIONAL CONFERENCE ON PARALLEL COMPUTING IN ELECTRICAL ENGINEERING, 2004, :33-38
[6]  
Fukuyama T., 2001, Transactions of the Institute of Electrical Engineers of Japan, Part D, V121-D, P835, DOI 10.1541/ieejias.121.835
[7]  
Gole A. M., 2006, IEEE POW ENG SOC GEN
[8]   A graphical electromagnetic simulation laboratory for power systems engineering programs [J].
Gole, AM ;
Nayak, OB ;
Sidhu, TS ;
Sachdev, MS .
IEEE TRANSACTIONS ON POWER SYSTEMS, 1996, 11 (02) :599-606
[9]   Statistical analysis of analog structures through variance calculation [J].
Graupner, A ;
Schwarz, W ;
Schüffny, R .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2002, 49 (08) :1071-1078
[10]  
Hana D., 2012, ELECT POWER COMPON S, V40