Soft x-ray excitonics

被引：82
作者：
Moulet, A. [1 ]
Bertrand, J. B. [1 ,2 ]
Klostermann, T. [1 ]
Guggenmos, A. [1 ]
Karpowicz, N. [1 ]
Goulielmakis, E. [1 ]
机构：
[1] Max Planck Inst Quantum Opt, Hans Kopfermann Str 1, D-85748 Garching, Germany
[2] Univ Laval, COPL, 2375 Terrasse St, Quebec City, PQ G1V 0A6, Canada
来源：
SCIENCE | 2017年 / 357卷 / 6356期
基金：
加拿大自然科学与工程研究理事会; 欧洲研究理事会;
关键词：
PHONON RELAXATION; SPECTRA; SEMICONDUCTORS; SPECTROSCOPY; EMISSION; LIGHT; DYNAMICS; HALIDES; STATES; SIO2;
D O I：
10.1126/science.aan4737
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
The dynamic response of excitons in solids is central to modern condensed-phase physics, material sciences, and photonic technologies. However, study and control have hitherto been limited to photon energies lower than the fundamental band gap. Here we report application of attosecond soft x-ray and attosecond optical pulses to study the dynamics of core-excitons at the L-2,L-3 edge of Si in silicon dioxide (SiO2). This attosecond x-ray absorption near-edge spectroscopy (AXANES) technique enables direct probing of the excitons' quasiparticle character, tracking of their subfemtosecond relaxation, the measurement of excitonic polarizability, and observation of dark core-excitonic states. Direct measurement and control of core-excitons in solids lay the foundation of x-ray excitonics.
引用
收藏
页码：1134 / 1137
页数：4
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