Evaluation of InP/InGaAsP distributed Bragg reflectors grown by chemical-beam epitaxy

被引:1
|
作者
Rudra, A [1 ]
Sagalowicz, L [1 ]
Leifer, K [1 ]
Behrend, J [1 ]
Berseth, CA [1 ]
Dehaese, O [1 ]
Carlin, JF [1 ]
Kapon, E [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Inst Micro & Optoelect, Dept Phys, CH-1015 Lausanne, Switzerland
关键词
InGaAsP; distributed Bragg reflector; electron microscopy;
D O I
10.1016/S0022-0248(98)00050-5
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We have evaluated the structure of high-reflectivity InP/InGaAsP distributed Bragg reflectors grown by chemical-beam epitaxy at a growth rate of 3 mu m/h. Transmission electron microscopy combined with electron energy loss spectroscopy indicate lateral fluctuations in the GaInAsP alloy composition, clearly visible in the 490-510 degrees C growth temperature range, but less perceptible between 460 and 480 degrees C. In the higher temperature range, the modulation in composition shows a higher frequency along the [1 (1) over bar 0] direction than along [1 1 0]. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:300 / 306
页数:7
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