Traceability of Vector Network Analyzer Measurements

被引：8

作者：

Wong, Ken ^{[1
]}

机构：

[1] Agilent Technol, Santa Rosa, CA 95403 USA

来源：

72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM: TIME DOMAIN AND FREQUENCY DOMAIN MEASUREMENT | 2008年

关键词：

D O I：

10.1109/ARFTG.2008.4804283

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Measurement traceability is NOT just a requirement in ISO quality standards. It is a necessity to ensure the accuracy of any measurement system. For vector network analyzers (VNA), the traceability of S-parameter measurements is not obvious. The latest generation of VNA is also capable of making measurements beyond S-parameters. This paper will present the latest developments in VNA measurement traceability chain, the key traceable parameters, calibration and verification standard traceability and some verification techniques and results.

引用

页码：157 / 167

页数：11

共 15 条

[1]

BELANGER BC, 1980, ASTM STANDARDIZATION, V8, P22

[2]

GINLEY R, 1999, MICROWAVE NETWORK AN, P22

[3]

Hall N, 2004, CHEM WORLD-UK, V1, P2

[4] Pin gap investigations for the 1.85 mm coaxial connector [J].

Hoffmann, Johannes Paul ;

Leuchtmann, Pascal ;

Vahldieck, Ruediger .

2007 EUROPEAN MICROWAVE CONFERENCE, VOLS 1-4, 2007, :388-391

[5]

*IEEE, 1992, 2872007 IEEE

[6]

MARKS RB, 1992, J RES NATL I STANDAR, V97

[7]

POLLARD R, 1984, 23 ARFTG C JUN 4 5

[8]

RIDLER NM, 2000, 56 ARFTG C NOV

[9]

RYTTING DK, 2001, 58 ARFTG C NOV 29 30

[10]

RYTTING DK, 1987, HP RF MICR S

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