Wide-Dynamic-Range CMOS Image Sensors-Comparative Performance Analysis

被引:91
作者
Spivak, Arthur [1 ]
Belenky, Alexander [1 ]
Fish, Alexander [1 ]
Yadid-Pecht, Orly [2 ]
机构
[1] Ben Gurion Univ Negev, VLSI Syst Ctr, IL-84105 Beer Sheva, Israel
[2] Univ Calgary, Dept Elect & Comp Engn, Calgary, AB T2N 1N4, Canada
关键词
Active pixel sensor (APS); CMOS image sensors (CIS); dynamic range (DR); noise floor (NF); sensitivity; sensors; signal-to-noise ratio (SNR); FIXED-PATTERN NOISE; LOGARITHMIC RESPONSE; PIXEL; ARRAY; APS;
D O I
10.1109/TED.2009.2030599
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A large variety of solutions for widening the dynamic range (DR) of CMOS image sensors has been proposed throughout the years. We propose a set of criteria upon which an effective comparative analysis of the performance of wide-DR (WDR) sensors can be done. Sensors for WDR are divided into seven categories: 1) companding sensors; 2) multimode sensors; 3) clipping sensors; 4) frequency-based sensors; 5) time-to-saturation (time-to-first spike) sensors; 6) global-control-over-the-integration-time sensors; and 7) autonomous-control-over-the-integration-time sensors. The comparative analysis for each category is based upon the quantitative assessments of the following parameters: signal-to-noise ratio, DR extension, noise floor, minimal transistor count, and sensitivity. These parameters are assessed using consistent assumptions and definitions, which are common to all WDR sensor categories. The advantages and disadvantages of each category in the sense of power consumption and data rate are discussed qualitatively. The influence of technology advancements on the proposed set of criteria is discussed as well.
引用
收藏
页码:2446 / 2461
页数:16
相关论文
共 61 条
[1]   A 1/3" VGA linear wide dynamic range CMOS image sensor implementing a predictive multiple sampling algorithm with overlapping integration intervals [J].
Acosta-Serafini, PM ;
Masaki, I ;
Sodini, CG .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2004, 39 (09) :1487-1496
[2]   A sensitivity and linearity improvement of a 100-dB dynamic range CMOS image sensor using a lateral overflow integration capacitor [J].
Akahane, N ;
Sugawa, S ;
Adachi, S ;
Mori, K ;
Ishiuchi, T ;
Mizobuchi, K .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2006, 41 (04) :851-858
[3]  
Akahane N., 2006, P IEEE INT SOL STAT, P1161
[4]  
BARNA SL, 2007, Patent No. 7186964
[5]   Global shutter CMOS image sensor with wide dynamic range [J].
Belenky, Alexander ;
Fish, Alexander ;
Spivak, Arthur ;
Yadid-Pecht, Orly .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2007, 54 (12) :1032-1036
[6]   A Snapshot CMOS Image Sensor With Extended Dynamic Range [J].
Belenky, Alexander ;
Fish, Alexander ;
Spivak, Arthur ;
Yadid-Pecht, Orly .
IEEE SENSORS JOURNAL, 2009, 9 (1-2) :103-111
[7]   A DPS array with programmable resolution and reconfigurable conversion time [J].
Bermak, A ;
Yung, YF .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2006, 14 (01) :15-22
[8]   A novel adaptive logarithmic digital pixel sensor [J].
Bermak, Amine ;
Kitchen, Alistair .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2006, 18 (17-20) :2147-2149
[9]  
BOAHEN KA, 1992, ADV NEUR IN, V4, P764
[10]  
BRAJOVIC V, 1995, P IEEE WORKSH CCDS A, P1