High Frequency TDDB of Reinforced Isolation Dielectric Systems

被引:39
作者
Bonifield, Tom [1 ]
Guo, Honglin [1 ]
West, Jeff [1 ]
Shichijo, Hisashi [2 ]
Tahir, Talha [2 ]
机构
[1] Texas Instruments Inc, Analog Technol Dev Dept, POB 655012, Dallas, TX 75265 USA
[2] Univ Texas Dallas, Dept Elect & Comp Engn, 800 W Campbell Rd, Richardson, TX 75080 USA
来源
2020 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2020年
关键词
frequency; isolation; reinforced; TDDB;
D O I
10.1109/irps45951.2020.9128352
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reinforced isolation provides protection of equipment and operators that interact with high voltage domains. Standards that define it have evolved over time from those that require only partial discharge to confirm reliability at the high voltage operating conditions, to those that also require a time dependent dielectric breakdown model (TDDB) for verifying reliable working voltage. In this paper we assess the impact of AC frequency, waveform, and rise and fall times on lifetime, which are important parameters that are not included in the current standards.
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页数:4
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