Non-Destructive Thickness Measurement Using Quasi-Static Resonators

被引：74
作者：
Boybay, Muhammed S. [1 ]
Ramahi, Omar M. [2 ]
机构：
[1] Antalya Int Univ, Dept Comp Engn, Antalya, Turkey
[2] Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada
来源：
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2013年 / 23卷 / 04期
关键词：
Complementary split ring resonators (CSRRs); near field sensors; thickness measurement; SPLIT-RING RESONATORS; LINES;
D O I：
10.1109/LMWC.2013.2249056
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A microwave sensor for non-destructive measurement of dielectric thickness is presented. The sensor is a quasi-static resonator and based on complementary split ring resonator (CSRR) structure. When the CSRR structure is backed by a conductive medium covered with a dielectric layer the resonance frequency of the CSRR has a strong dependence on the thickness of the dielectric layer. Effect of the size of CSRR sensor on the sensitivity is analyzed numerically. For experimental verification, a CSRR sensor that operates in the 1.6 to 2.3 GHz band is fabricated and excited by a microstrip line.
引用
收藏
页码：217 / 219
页数：3
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