Growth behavior of CuPc films by physical vapor deposition

被引:10
作者
Chiu, Yu-Chian [1 ]
Chen, Bing-Hong [1 ]
Jan, Da-Jeng [1 ]
Tang, Shiow-Jing [1 ]
Chiu, Kuan-Cheng [1 ]
机构
[1] Chung Yuan Christian Univ, Dept Phys, Ctr Nanotechnol, Chungli 32023, Taiwan
关键词
growth behavior; physical vapor deposition; organic molecular solid films; CuPc films; C-60 POLYCRYSTALLINE FILMS; SUBSTRATE-TEMPERATURE; PHTHALOCYANINE; MORPHOLOGY;
D O I
10.1002/crat.201000683
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Various Cu-phthalocyanine (CuPc) films were grown from physical vapor deposition on top of indium-tin-oxide glass substrates by controlling substrate temperature (T-sub), source temperature (T-sou), and growth time. From side-view SEM pictures, the growth rates for these CuPc films are estimated and can be categorized into three regions. From the Arrhenius plot of growth rate versus 1/T-sub, the activation energy E A can be obtained. As T-sou = 390 degrees C, for region (A) with T-sub < 140 degrees C, the growth of CuPc films is dominated by the adhesion process with E-A = 810 meV. For region (B) with 140 degrees C < T-sub < 320 degrees C, the growth is then limited by the steric character associated with the organic molecular solids with E-A = 740 meV. For region ( C) with T-sub > 320 degrees C, the re-evaporation of the CuPc adhered molecules from the interface becomes dominant. (C) 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:295 / 299
页数:5
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