Differential interference contrast x-ray microscopy with submicron resolution

被引：83
|
作者：
Wilhein, T
Kaulich, B
Di Fabrizio, E
Romanato, F
Cabrini, S
Susini, J
机构：
[1] Univ Appl Sci, RheinAhrCampus Remagen, D-53424 Remagen, Germany
[2] ELETTRA Sincrotrone Trieste, ESCA Microscopy Beamline, I-34012 Trieste, Italy
来源：
APPLIED PHYSICS LETTERS | 2001年 / 78卷 / 14期
关键词：
D O I：
10.1063/1.1360776
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Progress in lithography and nanofabrication [E. Di Fabrizio , Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy. (C) 2001 American Institute of Physics.
引用
收藏
页码：2082 / 2084
页数：3
相关论文
共 50 条
  • [1] Differential interference contrast x-ray microscopy
    Wilhein, T
    Kaulich, B
    Di Fabrizio, E
    Susini, J
    SOFT X-RAY AND EUV IMAGING SYSTEMS II, 2001, 4506 : 163 - 171
  • [2] Phase contrast hard x-ray microscopy with submicron resolution
    Lagomarsino, S
    Cedola, A
    Cloetens, P
    DiFonzo, S
    Jark, W
    Soullie, G
    Riekel, C
    APPLIED PHYSICS LETTERS, 1997, 71 (18) : 2557 - 2559
  • [3] Compact high-resolution differential interference contrast soft x-ray microscopy
    Bertilson, Michael C.
    Von Hofsten, Olov
    Lindblom, Magnus
    Wilhein, Thomas
    Hertz, Hans M.
    Vogt, Ulrich
    APPLIED PHYSICS LETTERS, 2008, 92 (06)
  • [4] Differential interference contrast x-ray microscopy with twin zone plates
    Kaulich, B
    Wilhein, T
    Di Fabrizio, E
    Romanato, F
    Altissimo, M
    Cabrini, S
    Fayard, B
    Susini, J
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2002, 19 (04) : 797 - 806
  • [5] Diffractive optical elements for differential interference contrast x-ray microscopy
    Di Fabrizio, E
    Cojoc, D
    Cabrini, S
    Kaulich, B
    Susini, J
    Facci, P
    Wilhein, T
    OPTICS EXPRESS, 2003, 11 (19): : 2278 - 2288
  • [6] Theoretical development of a high-resolution differential-interference-contrast optic for x-ray microscopy
    von Hofsten, Olov
    Bertilson, Michael
    Vogt, Ulrich
    OPTICS EXPRESS, 2008, 16 (02) : 1132 - 1141
  • [7] Differential interference contrast microscopy for cells using hard x-ray holography
    Matsuda, K.
    Lopez, J. C. A.
    Rehman, S.
    Misawa, M.
    Suzuki, Y.
    Takeuchi, A.
    Yasumoto, M.
    Hibino, K.
    Roy, M.
    Hanayama, R.
    Ishii, K.
    APPLIED OPTICS, 2018, 57 (17) : 4795 - 4801
  • [8] SUBMICRON RESOLUTION 3D X-RAY STRUCTURAL MICROSCOPY
    Larson, B. C.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C33 - C33
  • [9] Differential interference contrast for X-ray microscopy: Fabrication and characterization of twin zone plate optics
    Di Fabrizio, E
    Kaulich, B
    Wilhein, T
    Susini, J
    SURFACE REVIEW AND LETTERS, 2002, 9 (01) : 243 - 248
  • [10] Quantitative characterization of x-ray differential interference contrast microscopy using modulation transfer function
    Nakamura, Takashi
    Chang, Chang
    OPTICS EXPRESS, 2011, 19 (16): : 15304 - 15321
12345