Unified drain-current model of complementary p- and n-type OTFTs

被引:33
作者
Torricelli, Fabrizio [1 ]
Ghittorelli, Matteo [1 ]
Rapisarda, Matteo [2 ]
Valletta, Antonio [2 ]
Mariucci, Luigi [2 ]
Jacob, Stephanie [3 ]
Coppard, Romain [3 ]
Cantatore, Eugenio [4 ]
Kovacs-Vajna, Zsolt Miklos [1 ]
Colalongo, Luigi [1 ]
机构
[1] Univ Brescia, Dept Informat Engn, I-25123 Brescia, Italy
[2] CNR IMM, Rome, Italy
[3] CEA LITEN, F-38054 Grenoble 9, France
[4] Eindhoven Univ Technol, Dept Elect Engn, NL-5600 MB Eindhoven, Netherlands
关键词
Organic thin-film transistor (OTFT); Organic field-effect transistor (OFET); Modelling; Circuit design; Complementary technology; THIN-FILM TRANSISTORS; FIELD-EFFECT TRANSISTORS; AMORPHOUS ORGANIC TRANSISTORS; FLEXIBLE PLASTIC SUBSTRATE; DENSITY-OF-STATES; CHARGE-TRANSPORT; ELECTRICAL CHARACTERISTICS; INTEGRATED-CIRCUITS; WIDE DISTRIBUTION; AMOLED DISPLAY;
D O I
10.1016/j.orgel.2015.03.021
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A unified drain current model of complementary (p- and n-type) organic thin film transistors (OTFTs) is presented. The model is physically based and takes into account the detailed properties of the organic semiconductor through the density of states (DOS). The drain current depends on the geometrical and physical parameters of the transistor, on the applied gate, drain and source voltages, and on the surface potential at the source and drain contacts. An analytical expression of the surface potential is derived. The proposed model is validated with the numerical calculations and the measurements of both p-and n-type OTFTs fabricated in a printed complementary technology. The provided analyses show that the model is continuous, accurate, and includes the main physical effects taking place in complementary organic transistors. Thanks to its analytical and symmetric formulation, it is suitable for the design of organic integrated circuits. Moreover, the unified physical picture provided by the model enables the extraction of the OTFTs physical parameters, thus it is a very powerful tool for the technology characterization. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:5 / 11
页数:7
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