Fast Active-Quenching Circuit for Free-Running InGaAs(P)/InP Single-Photon Avalanche Diodes

被引：15
作者：
Liu, Junliang [1 ,2 ]
Li, Yongfu [1 ]
Ding, Lei [3 ]
Wang, Ying [2 ]
Zhang, Tingfa [1 ,2 ]
Wang, Qingpu [1 ]
Fang, Jiaxiong [1 ]
机构：
[1] Shandong Univ, Adv Res Ctr Opt, Jinan 250100, Peoples R China
[2] Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Peoples R China
[3] Chinese Acad Sci, Shanghai Inst Tech Phys, Key Lab Infrared Detect & Imaging Technol, Shanghai 200083, Peoples R China
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 2016年 / 52卷 / 10期
关键词：
Single-photon avalanche diode; active-quenching circuit; free-running single-photon detector; PHOTODIODES; RESET;
D O I：
10.1109/JQE.2016.2597798
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A fast active-quenching circuit (FAQC) based on SiGe Hetero-junction Bipolar Transistor (HBT) and InGaP/GaAs HBT integrated circuits is designed for use with free-running single-photon avalanche diodes (SPADs). The performances of both InGaAsP/InP SPAD and InGaAs/InP SPAD are tested. Results show that the typical avalanche duration using the FAQC is 1.6 ns, and the total afterpulse probability is lower than 10% when the hold-off time is above 1 mu s at 1.5 V excess bias or 10 mu s at 3.0 V excess bias. This result is comparable to recently developed negative-feedback avalanche diodes. The FAQC is based on commercially available integrated circuits and can be used with typical SPADs, providing a low-cost approach to build a free-running single-photon detector.
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页数：6
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