Characterization and modeling of the substrate noise and its impact on the phase noise of VCO

被引：0

作者：

Liao, HL ^{[1
]}

Rustagi, SC ^{[1
]}

Shi, JL ^{[1
]}

Xiong, YZ ^{[1
]}

机构：

[1] Inst Microelect, Singapore 117685, Singapore

来源：

2003 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS | 2003年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a simple scheme for estimating the digital switching noise at the sensitive RF nodes with the help of a lumped element model for the substrate network. The model parameters have been extracted from the 2-port RF measurements. The efficacy of different isolation schemes such as grounded P+ guard bars and deep N-well has been investigated using phase noise of a VCO as a figure of merit.

引用

页码：247 / 250

页数：4

共 50 条

[1] VCO phase noise characterization
Xu, DQ
Branner, GR
40TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1 AND 2, 1998, : 619 - 622
[2] The effect of substrate noise on VCO performance
Checka, N
Wentzloff, DD
Chandrakasan, A
Reif, R
2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, Digest of Papers, 2005, : 523 - 526
[3] Low voltage low phase noise CMOS VCO and its flicker noise influence
Itoh, N
IEICE TRANSACTIONS ON ELECTRONICS, 2003, E86C (06) : 1062 - 1068
[4] VCO phase noise and sideband spurs due to substrate noise generated by on-chip digital circuits
Mendez, M. A.
Osorio, J. F.
Mateo, D.
Aragones, X.
Gonzalez, J. L.
2006 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS, 2006, : 121 - +
[5] VCO phase noise and sideband spurs due to substrate noise generated by on-chip digital circuits
Mendez, M. A.
Osorio, J. F.
Mateo, D.
Aragones, X.
Gonzalez, J. L.
2006 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM, 2006, : 101 - 104
[6] Measurement and modeling of the sensitivity of LC-VCO's to substrate noise perturbations
Bronckers, S.
Vandersteen, G.
Soens, C.
Van der Plas, G.
Rolain, Y.
2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5, 2007, : 750 - +
[7] Modeling of substrate noise generation, isolation, and impact for an LC-VCO and a digital modem on mp a lightly-doped substrate
Soens, Charlotte
Van der Plas, Geert
Badaroglu, Mustafa
Wambacq, Piet
Donnay, Stephane
Rolain, Yves
Kuijk, Maarten
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2006, 41 (09) : 2040 - 2051
[8] A method for VCO phase noise analysis
Simic, D
Hadzi-Vukovic, J
Jevtic, M
TELSIKS 2001, VOL 1 & 2, PROCEEDINGS, 2001, : 309 - 312
[9] Externally induced VCO phase noise
Colin, D., 1600, Horizon House (45):
[10] Reduction of VCO Phase Noise through Forward Substrate Biasing of Switched MOSFETs
Siprak, Domagoj
Tiebout, Marc
Baumgartner, Peter
ESSCIRC 2008: PROCEEDINGS OF THE 34TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE, 2008, : 326 - +

← 1 2 3 4 5 →