Optical and electrical properties of two-dimensional palladium diselenide

被引:86
|
作者
Zhang, George [1 ,2 ]
Amani, Matin [1 ,2 ]
Chaturvedi, Apoorva [3 ]
Tan, Chaoliang [1 ,2 ]
Bullock, James [1 ,2 ]
Song, Xiaohui [4 ,5 ]
Kim, Hyungjin [1 ,2 ]
Lien, Der-Hsien [1 ,2 ]
Scott, Mary C. [4 ,5 ]
Zhang, Hua [3 ,6 ]
Javey, Ali [1 ,2 ]
机构
[1] Univ Calif Berkeley, Elect Engn & Comp Sci, Berkeley, CA 94720 USA
[2] Lawrence Berkeley Natl Lab, Mat Sci Div, Berkeley, CA 94720 USA
[3] Nanyang Technol Univ, Ctr Programmable Mat, Sch Mat Sci & Engn, Block N4-1,50 Nanyang Ave, Singapore 639798, Singapore
[4] Univ Calif Berkeley, Mat Sci & Engn, Berkeley, CA 94720 USA
[5] Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
[6] City Univ Hong Kong, Dept Chem, Kowloon, Hong Kong, Peoples R China
关键词
TRANSITION;
D O I
10.1063/1.5097825
中图分类号
O59 [应用物理学];
学科分类号
摘要
Two-dimensional (2D) noble-metal dichalcogenides exhibit exceptionally strong thickness-dependent bandgaps, which can be leveraged in a wide variety of device applications. A detailed study of their optical (e.g., optical bandgaps) and electrical properties (e.g., mobilities) is important in determining potential future applications of these materials. In this work, we perform detailed optical and electrical characterization of 2D PdSe2 nanoflakes mechanically exfoliated from a single-crystalline source. Layer-dependent bandgap analysis from optical absorption results indicates that this material is an indirect semiconductor with bandgaps of approximately 1.37 and 0.50eV for the monolayer and bulk, respectively. Spectral photoresponse measurements further confirm these bandgap values. Moreover, temperature-dependent electrical measurements of a 6.8-nm-thick PdSe2 flake-based transistor show effective electron mobilities of 130 and 520cm(2)V(-1)s(-1) at 300K and 77K, respectively. Finally, we demonstrate that PdSe2 can be utilized for short-wave infrared photodetectors. A room-temperature specific detectivity (D-*) of 1.8x10(10)cm Hz(1/2) W-1 at 1 mu m with a band edge at 1.94 mu m is achieved on a 6.8-nm-thick PdSe2 flake-based photodetector.
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页数:5
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