Fabrication of nanoparticle pattern through atomic force microscopy tip-induced deposition on modified silicon surfaces

被引:3
|
作者
Liao, JH [1 ]
Huang, L
Gu, N
机构
[1] SE Univ, Natl Lab Mol & Biomol Elect, Nanjing 210096, Peoples R China
[2] SE Univ, Ctr Nanoscale Sci & Technol, Nanjing 210096, Peoples R China
来源
CHINESE PHYSICS LETTERS | 2002年 / 19卷 / 01期
关键词
D O I
10.1088/0256-307X/19/1/342
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
With an atomic force microscopy (AFM) tip used as a "nib" and gold colloidal particles as "ink", patterns of gold colloidal particles have been deposited successfully from the AFM tip onto specific regions of silicon surfaces modified by bifunctional mercaptosilane, i.e. (3-mercaptopropyl)-triethoxysilane. This was used as an adhesion agent and can immobilize nanoparticles delivered from the AFM tip onto the substrate surface.
引用
收藏
页码:134 / 136
页数:3
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