Differential phase contrast x-ray microimaging with scanning-imaging x-ray microscope optics

被引：4
作者：
Takeuchi, Akihisa [1 ]
Suzuki, Yoshio [1 ]
Uesugi, Kentaro [1 ]
机构：
[1] JASRI SPring 8, Sayo, Hyogo 6795198, Japan
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2012年 / 83卷 / 08期
关键词：
FRESNEL ZONE-PLATE; SEGMENTED DETECTOR; REFRACTIVE PRISM; RESOLUTION;
D O I：
10.1063/1.4739761
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A novel x-ray microimaging system that consists of a scanning microscope optics with a one-dimensional focusing (line-focusing) device and an imaging microscope optics with a one-dimensional objective is developed. These two optical systems are set normal to each other regarding the optical axis. A two-dimensional image is obtained with one-dimensional translation scan of the line probe. During scans, positional data in the normal to the scanning direction are obtained simultaneously with the imaging microscope optics. Differential phase contrast (DPC) image and absorption contrast (AC) image can be arbitrarily obtained by image processing after data acquisition. Preliminary experiment has been carried out by using a couple of one-dimensional Fresnel zone plate as the linear-focusing device and the one-dimensional objective. Two-dimensional DPC and AC images of test sample have been successfully obtained with 8 keV x-rays. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4739761]
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页数：9
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