Diffraction of SH-Waves on the Interface Defect in the Joint of an Elastic Layer and a Half Space

We solve the problem of diffraction of elastic SH-waves on a defect formed on the interface of an elastic layer rigidly joined with a half space. The defect is modeled by a semiinfinite plane with given mixed-type impedance boundary conditions. By using the Wiener-Hopf technique, we obtain the rigorous solution of the problem. This solution is used to study the behavior of the coefficients of transformation of the modes of scattered waves at the tip of the defect, as well as the energy reflection and transmission coefficients of waves for various subdomains of the structure as functions of the geometric and physicomechanical parameters of the problem. In order to perform the diagnostics of the edge of the analyzed defect, we carried out the physical analysis of the formation of the field of displacements on the free surface of the layer.