Texture determination by energy-dispersive XRD

被引：4
作者：
Player, MA [1 ]
Shi, Z
Clark, SM
Miller, MC
Tang, CC
机构：
[1] Univ Aberdeen, Dept Engn, Aberdeen AB24 3UE, Scotland
[2] CLRC, Daresbury Lab, Warrington WA4 4AD, Cheshire, England
来源：
PHYSICA B | 1998年 / 248卷
基金：
英国工程与自然科学研究理事会;
关键词：
energy dispersive; texture; thin film; nickel;
D O I：
10.1016/S0921-4526(98)00272-5
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for determination of crystallographic texture, and we present an instrument for use on Station 16.4 of the Daresbury SRS, designed primarily for texture studies on surface layers. The instrument allows measurement at low angles of incidence to enhance surface sensitivity. It can typically acquire texture information at 176 (psi, phi) orientation points in around 2 h, and provides a complete set of pole figures simultaneously. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：405 / 410
页数：6
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