Demonstration of enhanced absorption in thin film Si solar cells with textured photonic crystal back reflector

被引：198

作者：

Zeng, L. ^{[1
]}

Bermel, P. ^{[2
]}

Yi, Y. ^{[1
]}

Alamariu, B. A. ^{[3
]}

Broderick, K. A. ^{[3
]}

Liu, J. ^{[1
]}

Hong, C. ^{[1
]}

Duan, X. ^{[1
]}

Joannopoulos, J. ^{[2
]}

Kimerling, L. C. ^{[1
]}

机构：

[1] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA

[2] MIT, Dept Phys, Cambridge, MA 02139 USA

[3] MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA

来源：

APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 22期

关键词：

current density; diffraction gratings; distributed Bragg reflectors; elemental semiconductors; light absorption; photonic crystals; reflectivity; silicon; solar cells; thin film devices;

D O I：

10.1063/1.3039787

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Herein the authors report the experimental application of a powerful light trapping scheme, the textured photonic crystal (TPC) backside reflector, to thin film Si solar cells. TPC combines a one-dimensional photonic crystal as a distributed Bragg reflector with a diffraction grating. Light absorption is strongly enhanced by high reflectivity and large angle diffraction, as designed with scattering matrix analysis. 5 mu m thick monocrystalline thin film Si solar cells integrated with TPC were fabricated through an active layer transfer technique. Measured short circuit current density J(sc) was increased by 19%, compared to a theoretical prediction of 28%.

引用

页数：3

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