Optical constants of polycrystalline Cd1-xZnxTe thin films by spectroscopic ellipsometry

被引：0
作者：
Rao, KP [1 ]
Hussain, OM [1 ]
Naidu, BS [1 ]
Reddy, PJ [1 ]
机构：
[1] SRI VENKATESWARA UNIV, DEPT PHYS, TIRUPATI 517502, ANDHRA PRADESH, INDIA
来源：
ADVANCED MATERIALS FOR OPTICS AND ELECTRONICS | 1997年 / 7卷 / 03期
关键词：
Cd1-xZnxTe thin films; optical constants; spectroscopic ellipsometry;
D O I：
暂无
中图分类号：
O69 [应用化学];
学科分类号：
081704 ;
摘要：
Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (epsilon* = epsilon(1) + epsilon(2)), refractive index (n), extinction coefficient (k), absorption coefficient (alpha) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd1-xZnxTe thin films formed on Coming 7059 glass substrates. The experimental spectra were measured in the photon energy range 1.1-5.6 eV. The spectra revealed distinct peaks at energies corresponding to interband transitions. (C) 1997 by John Wiley & Sons, Ltd.
引用
收藏
页码：109 / 115
页数：7
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