Advanced reconstruction algorithms for electron tomography: From comparison to combination

被引：65
作者：
Goris, B. [1 ]
Roelandts, T. [2 ]
Batenburg, K. J. [2 ,3 ]
Mezerji, H. Heidari [1 ]
Bals, S. [1 ]
机构：
[1] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium
[2] Univ Antwerp, Vis Lab, B-2610 Antwerp, Belgium
[3] Ctr Wiskunde & Informat, NL-1098 XG Amsterdam, Netherlands
来源：
ULTRAMICROSCOPY | 2013年 / 127卷
关键词：
Electron tomography; Total variation minimization; Discrete algebraic reconstruction technique; Reconstruction algorithm; 3-DIMENSIONAL RECONSTRUCTION; NANOPARTICLES; MICROSCOPY;
D O I：
10.1016/j.ultramic.2012.07.003
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
In this work, the simultaneous iterative reconstruction technique (SIRT), the total variation minimization (TVM) reconstruction technique and the discrete algebraic reconstruction technique (DART) for electron tomography are compared and the advantages and disadvantages are discussed. Furthermore, we describe how the result of a three dimensional (3D) reconstruction based on TVM can provide objective information that is needed as the input for a DART reconstruction. This approach results in a tomographic reconstruction of which the segmentation is carried out in an objective manner. (c) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码：40 / 47
页数：8
相关论文
共 25 条
[1]   A new approach for electron tomography: Annular dark-field transmission electron microscopy [J].
Bals, S ;
Van Tendeloo, G ;
Kisielowski, C .
ADVANCED MATERIALS, 2006, 18 (07) :892-+
[2]   Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes [J].
Bals, Sara ;
Batenburg, K. Joost ;
Verbeeck, Jo ;
Sijbers, Jan ;
Van Tendeloo, Gustaaf .
NANO LETTERS, 2007, 7 (12) :3669-3674
[3]   Quantitative Three-Dimensional Modeling of Zeotile Through Discrete Electron Tomography [J].
Bals, Sara ;
Batenburg, K. Joost ;
Liang, Duoduo ;
Lebedev, Oleg ;
Van Tendeloo, Gustaaf ;
Aerts, Alexander ;
Martens, Johan A. ;
Kirschhock, Christine E. A. .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2009, 131 (13) :4769-4773
[4]   High-resolution three-dimensional imaging of dislocations [J].
Barnard, J. S. ;
Sharp, J. ;
Tong, J. R. ;
Midgley, P. A. .
SCIENCE, 2006, 313 (5785) :319-319
[5]   A semi-automatic algorithm for grey level estimation in tomography [J].
Batenburg, K. J. ;
van Aarle, W. ;
Sijbers, J. .
PATTERN RECOGNITION LETTERS, 2011, 32 (09) :1395-1405
[6]   3D imaging of nanomaterials by discrete tomography [J].
Batenburg, K. J. ;
Bals, S. ;
Sijbers, J. ;
Kuebel, C. ;
Midgley, P. A. ;
Hernandez, J. C. ;
Kaiser, U. ;
Encina, E. R. ;
Coronado, E. A. ;
Van Tendeloo, G. .
ULTRAMICROSCOPY, 2009, 109 (06) :730-740
[7]   DART: A Practical Reconstruction Algorithm for Discrete Tomography [J].
Batenburg, Kees Joost ;
Sijbers, Jan .
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2011, 20 (09) :2542-2553
[8]  
Candès EJ, 2008, IEEE SIGNAL PROC MAG, V25, P21, DOI 10.1109/MSP.2007.914731
[9]   Stable signal recovery from incomplete and inaccurate measurements [J].
Candes, Emmanuel J. ;
Romberg, Justin K. ;
Tao, Terence .
COMMUNICATIONS ON PURE AND APPLIED MATHEMATICS, 2006, 59 (08) :1207-1223
[10]   For most large underdetermined systems of linear equations the minimal l1-norm solution is also the sparsest solution [J].
Donoho, DL .
COMMUNICATIONS ON PURE AND APPLIED MATHEMATICS, 2006, 59 (06) :797-829
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