Submicron InGaAs/InAlAs/InP high-electron mobility transistors for high-speed lightwave applications

被引:0
作者
Weiner, JS [1 ]
Wang, YC [1 ]
Kuo, JM [1 ]
Tsai, HS [1 ]
Sivco, D [1 ]
Cho, AY [1 ]
Chen, YK [1 ]
机构
[1] AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
来源
PROCEEDINGS OF THE STATE-OF-THE-ART PROGRAM ON COMPOUND SEMICONDUCTORS (SOTAPOCS XXX) | 1999年 / 99卷 / 04期
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中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
We have fabricated HEMTs using argon implant isolation that have device-to-device resistance similar to that measured for mesa-isolated HEMTs. The argon implant-isolated HEMTs have measured f(t) and f(max) of 140 GHz and 200 GHz. This performance is comparable to that of the mesa-isolated HEMTs. After de-embedding of the test pad capacitances f(t) is found to be 200 GHz.
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页码:135 / 140
页数:6
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