Full field electron spectromicroscopy applied to ferroelectric materials

被引：45

作者：

Barrett, N. ^{[1
]}

Rault, J. E. ^{[1
]}

Wang, J. L. ^{[1
]}

Mathieu, C. ^{[1
]}

Locatelli, A. ^{[2
]}

Mentes, T. O. ^{[2
]}

Nino, M. A. ^{[3
]}

Fusil, S. ^{[4
]}

Bibes, M. ^{[5
]}

Barthelemy, A. ^{[5
]}

Sando, D. ^{[5
]}

Ren, W. ^{[6
,7
]}

Prosandeev, S. ^{[6
]}

Bellaiche, L. ^{[6
]}

Vilquin, B. ^{[8
]}

Petraru, A. ^{[9
]}

Krug, I. P. ^{[10
,11
]}

Schneider, C. M. ^{[10
,11
]}

机构：

[1] IRAMIS SPCSI LENSIS, F-91191 Gif Sur Yvette, France

[2] Sincrotrone Trieste SCpA, I-34149 Trieste, Italy

[3] Inst Madrileno Estudios Avanzados Nanociencia IMD, Madrid 28049, Spain

[4] Univ Evry Val dEssonne, F-91025 Evry, France

[5] Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France

[6] Univ Arkansas, Dept Phys, Fayetteville, AR 72701 USA

[7] Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China

[8] Univ Lyon, Ecole Cent Lyon, Inst Nanotechnol Lyon, F-69134 Ecully, France

[9] Univ Kiel, Tech Fak, D-24143 Kiel, Germany

[10] Forschungszentrum Julich, Peter Grunberg Inst PGI 6, D-52425 Julich, Germany

[11] Forschungszentrum Julich, JARA FIT, D-52425 Julich, Germany

来源：

JOURNAL OF APPLIED PHYSICS | 2013年 / 113卷 / 18期

基金：

美国国家科学基金会;

关键词：

SURFACE; MICROSCOPE; POLARIZATION; MULTIFERROICS; SPECTROSCOPY; REDUCTION; DOMAINS; IMAGE; FILMS;

D O I：

10.1063/1.4801968

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structures of ferroelectric materials is reviewed. Electron optics in both techniques gives spatial resolution of a few tens of nanometres. PEEM images photoelectrons, whereas LEEM images reflected and elastically backscattered electrons. Both PEEM and LEEM can be used in direct and reciprocal space imaging. Together, they provide access to surface charge, work function, topography, chemical mapping, surface crystallinity, and band structure. Examples of applications for the study of ferroelectric thin films and single crystals are presented. (C) 2013 AIP Publishing LLC

引用

页数：13

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