Ultrafast imaging of transient electronic plasmas produced in conditions of femtosecond waveguide writing in dielectrics

被引:43
作者
Gawelda, W. [1 ]
Puerto, D. [1 ]
Siegel, J. [1 ]
Ferrer, A. [1 ]
Ruiz de la Cruz, A. [1 ]
Fernandez, H. [1 ]
Solis, J. [1 ]
机构
[1] CSIC, Inst Opt, Laser Proc Grp, E-28006 Madrid, Spain
关键词
D O I
10.1063/1.2988275
中图分类号
O59 [应用物理学];
学科分类号
摘要
Femtosecond laser-induced plasmas in bulk dielectrics are imaged under waveguide writing conditions, for different polarizations, pulse durations, and processing depths, and their temporal evolution is measured using ultrafast pump-probe microscopy. The irradiation beam profile is elliptically shaped yielding a disklike focal volume. We demonstrate for doped phosphate glass that increasing the pulse duration improves the spatial distribution of deposited energy by minimizing beam filamentation and prefocal depletion effects. As a consequence, energy deposition in the desired volume is greatly enhanced. Our results identify key parameters for optimizing femtosecond laser processing of dielectrics and different strategies to minimize energy loss channels. (C) 2008 American Institute of Physics.
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页数:3
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