TiAlN film preparation by Y-shape filtered-arc-deposition system

被引:19
作者
Mashiki, Takayuki [1 ]
Hikosaka, Hiroki [1 ]
Tanoue, Hideto [1 ]
Takikawa, Hirofumi [1 ]
Hasegawa, Yushi [2 ]
Taki, Makoto [2 ]
Kumagai, Masao [3 ]
Kamiya, Masao [1 ,4 ]
机构
[1] Toyohashi Univ Technol, Dept Elect & Elect Engn, Aichi 4418580, Japan
[2] Onward Ceram Coating Co Ltd, Off Res & Dev, Nomi, Ishikawa 9290111, Japan
[3] Kanagawa Ind Technol Res Ctr, Mat Technol Div, Ebina, Kanagawa 2430435, Japan
[4] Itoh Opt Ind Co Ltd, Dev Technol Dept, Aichi 4430041, Japan
基金
日本学术振兴会; 日本科学技术振兴机构;
关键词
Y-FAD; TiAlN; composition distribution; film properties;
D O I
10.1016/j.tsf.2007.11.097
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A Y-shape filtered-arc-deposition system, which has two arc sources and a common plasma-transport-duct, was operated under nitrogen gas, and a titanium aluminum nitride (TiAlN) thin film was prepared with Ti and Al cathodes. Two filtered-arc plasma beams were not completely combined into one beam even at the exit of the common duct. Thus, TiAlN film with composition-uniform distribution was not obtained at the fixed substrate position. However, different composition films were easily obtained at one time. Then various-composition films of TiAlN with different arc currents were prepared and film properties were measured. The surface roughness in arithmetical mean roughness was less than 3 run on a 1.5-nm roughness substrate. The density of TiAlN increased with the Ti-content ratio, and its hardness tended to weakly increase with Al-content ratio. The maximum hardness was 36 GPa. Ti-rich film has internal compression stress and Al-rich film has internal tensile stress. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:6650 / 6654
页数:5
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