Property of Sn-37Pb solder bumps with different diameter during thermal shock

被引:5
作者
Gan, Guisheng [1 ,2 ]
Yang, Donghua [1 ]
Wu, Yi-ping [3 ]
Liu, Xin [4 ]
Sun, Pengfei [5 ]
Xia, Daquan [1 ]
Cao, Huadong [1 ]
Jiang, Liujie [1 ]
Tian, Mizhe [1 ]
机构
[1] Chongqing Univ Technol, Chongqing Municipal Engn Res Ctr, Inst Higher Educ Special Welding Mat & Technol, Chongqing, Peoples R China
[2] Chongqing Electromech Vocat Inst, Ordnance Equipment Res Inst, Chongqing, Peoples R China
[3] Huazhong Univ Sci & Technol, Coll Mat Sci & Engn, Wuhan, Peoples R China
[4] Chongqing Vocat & Tech Univ Mechatron, Ordnance Equipment Res Inst, Chongqing, Peoples R China
[5] Chongqing Jiaotong Univ, Sch Mechanotron & Vehicle Engn, Chongqing, Peoples R China
基金
中国国家自然科学基金;
关键词
Sn-37Pb; Thermal shock; Shear strength; Failure; Tearing crack; Microstructure; Solder bumps; Fatigue; Tensile testing;
D O I
10.1108/SSMT-12-2019-0046
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Purpose The impact strength of solder joint under high strain rate was evaluated by board level test method. However, the impact shear test of single solder bump was more convenient and economical than the board level test method. With the miniaturization of solder joints, solder joints were more prone to failure under thermal shock and more attention has been paid to the impact reliability of solder joint. But Pb-free solder joints may be paid too much attention and Sn-Pb solder joints may be ignored. Design/methodology/approach In this study, thermal shock test between -55 degrees C and 125 degrees C was conducted on Sn-37Pb solder bumps in the BGA package to investigate microstructural evolution and growth mechanism of interfacial intermetallic compounds (IMCs) layer. The effects of thermal shock and ball diameter on the mechanical property and fracture behavior of Sn-37Pb solder bumps were discussed. Findings With the increase of ball size, the same change tendency of shear strength with thermal shock cycles. The shear strength of the solder bumps was the highest after reflow; with the increase of the number of thermal shocks, the shear strength of the solder bumps was decreased. But at the time of 2,000 cycles, the shear strength was increased to the initial strength. Minimum shear strength almost took place at 1,500 cycles in all solder bumps. The differences between maximum shear strength and minimum shear strength were 9.11 MPa and 16.83 MPa, 17.07 MPa and 15.59 MPa in phi 0.3 mm and phi 0.4 mm, phi 0.5 mm and phi 0.6 mm, respectively, differences were increased with increasing of ball size. With similar reflow profile, the thickness of IMC decreased as the diameter of the ball increased. The thickness of IMC was 2.42 mu m and 2.17 mu m, 1.63 mu m and 1.77 mu m with increasing of the ball size, respectively. Originality/value Pb-free solder was gradually used to replace traditional Sn-Pb solder and has been widely used in industry. Nevertheless, some products inevitably used a mixture of Sn-Pb and Pb-free solder to make the transition from Sn-Pb to Pb-free solder. Therefore, it was very important to understand the reliability of Sn-Pb solder joint and more further research works were also needed.
引用
收藏
页码:94 / 104
页数:11
相关论文
共 30 条
[1]   Failure mechanisms of solder interconnects under current stressing in advanced electronic packages [J].
Chan, Y. C. ;
Yang, D. .
PROGRESS IN MATERIALS SCIENCE, 2010, 55 (05) :428-475
[2]  
Chang Jun-ling, 2005, Journal of Functional Materials and Devices, V11, P445
[3]   Microstructure, orientation and damage evolution in SnPb, SnAgCu, and mixed solder interconnects under thermomechanical stress [J].
Chen, Hongtao ;
Wang, Ling ;
Han, Jing ;
Li, Mingyu ;
Liu, Hao .
MICROELECTRONIC ENGINEERING, 2012, 96 :82-91
[4]   Experimental analysis of Sn-3.0Ag-0.5Cu solder joint board-level drop/vibration impact failure models after thermal/isothermal cycling [J].
Gu, Jian ;
Lin, Jian ;
Lei, Yongping ;
Fu, Hanguang .
MICROELECTRONICS RELIABILITY, 2018, 80 :29-36
[5]   Solder joint reliability in flip chip package with surface treatment of ENIG under thermal shock test [J].
Ha, Sang-Su ;
Ha, Sang-Ok ;
Yoon, Jeong-Won ;
Kim, Jong-Woong ;
Ko, Min-Kwan ;
Kim, Dae-Gon ;
Kim, Sung-Jin ;
Hong, Tae-Hwan ;
Jung, Seung-Boo .
METALS AND MATERIALS INTERNATIONAL, 2009, 15 (04) :655-660
[6]   Phase coarsening and crack growth rate during thermo-mechanical cycling of 63Sn37Pb solder joints [J].
Hacke, PL ;
Fahmy, Y ;
Conrad, H .
JOURNAL OF ELECTRONIC MATERIALS, 1998, 27 (08) :941-947
[7]   Reliability evaluation of underfill encapsulated Pb- free flip chip package under thermal shock test [J].
Kim, Dae-Gon ;
Kim, Jong-Woong ;
Ha, Sang-Su ;
Koo, Ja-Myeong ;
Noh, Bo-In ;
Jung, Seung-Boo .
ECO-MATERIALS PROCESSING AND DESIGN VIII, 2007, 544-545 :621-+
[8]   Evaluation of solder joint reliability in flip chip package under thermal shock test [J].
Kim, DG ;
Kim, JW ;
Jung, SB .
THIN SOLID FILMS, 2006, 504 (1-2) :426-430
[9]   Impact reliability estimation of lead free solder joint with IMC layer [J].
Kim, Jong-Min ;
Woo, Seung-Wan ;
Chang, Yoon-Suk ;
Kim, Young-Jin ;
Choi, Jae-Boong ;
Ji, Kum-Young .
THIN SOLID FILMS, 2009, 517 (14) :4255-4259
[10]   A review: On the development of low melting temperature Pb-free solders [J].
Kotadia, Hiren R. ;
Howes, Philip D. ;
Mannan, Samjid H. .
MICROELECTRONICS RELIABILITY, 2014, 54 (6-7) :1253-1273