Ambient intelligence in product life-cycle management

被引：17
作者：
Kovacs, G.
Kopacsi, S.
Haidegger, G.
Michelini, R.
机构：
[1] Hungarian Acad Sci, Comp & Automat Res Inst, CIM Res Lab, H-1111 Budapest, Hungary
[2] Univ Pecs, Pecs, Hungary
[3] Budapest Univ Technol & Econ, Budapest, Hungary
[4] Dennis Gabor Coll, Budapest, Hungary
[5] Univ Genoa, DIMEC, Genoa, Italy
来源：
ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE | 2006年 / 19卷 / 08期
关键词：
product life-cycle management; service engineering; ambient intelligence;
D O I：
10.1016/j.engappai.2006.01.017
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
To fulfil the increasing demands today the short innovation time and the high quality of production itself is not enough in production of goods, but all phases of a product (from idea to recycling) should be managed by advanced tools and means. Nowadays the competition among companies, joined to the environmental protection rules, is so compelling that they should not only be on the top of technology in the area, but also run their business according to life-long models. The emphasis on the product post-sale life is common for these models. The most popular model is Product Life-cycle Management, for manufacturing companies, or Service Engineering (SE), for service-oriented companies, and, for both, common paradigms are in maintenance, with conformance-to-use certification. The paper introduces some basic research results achieved in the application of Ambient Intelligence, and suggests considering maintenance as a cross section of the two business paradigms. The importance of SE is specially underlined in this work. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码：953 / 965
页数：13
相关论文
共 21 条
[1]  
ABOWD GD, 2004, INVESTIGASTING RES I
[2]  
AILISTO H, 2003, ITEA 2003
[3]  
AMERI F, PRODUCT LIFECYCLE MA, P1
[4]  
ARNAIZ A, 2004, P INT IMS FOR 2004 G, V1, P300
[5]  
BENGTSSON M, 2004, P 17 EUR MAINT C 11
[6]  
Garetti Marco, 2004, P INT IMS FOR 2004 G, V2, P917
[7]  
GROSS S, 2004, P 11 IFAC S INF CONT, P65
[8]  
GUPTA M, 2003, AMBIENT INTELLIGENCE
[9]  
*ISTAG IST ADV GRO, ADV GROUP EUR COMM I
[10]   The positive trigger voltage lowering effect for latch-up [J].
Lee, JH ;
Weng, WT ;
Shih, JR ;
Yu, KF ;
Ong, TC .
IPFA 2004: PROCEEDINGS OF THE 11TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 2004, :85-88
123