Can Erasure Codes Damage Reliability in SSD-Based Storage Systems?

被引:6
作者
Chamazcoti, Saeideh Alinezhad [1 ]
Safaei, Bardia [1 ]
Miremadi, Seyed Ghassem [1 ]
机构
[1] Sharif Univ Technol, Dept Comp Engn, Tehran, Iran
关键词
Erasure codes; solid state disk (SSD); P/E cycles; reliability; storage systems; NAND FLASH MEMORY;
D O I
10.1109/TETC.2017.2693424
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Erasure codes are applied in storage systems including both Hard Disk Drive (HDD) and Solid State Disk (SSD) to protect arrays of disks against failures. Applying these codes in SSD-based systems incurs additional number of Program/Erase (P/E) cycles on each disk, which may accelerate the wear-out of disks. This means that while erasure codes improve reliability of SSD-based systems, they impose a side-effect that may degrade reliability as the number of P/E cycles increases. This paper investigates the benefit and side-effect of erasure codes on reliability of SSD-based systems. The investigation attempts to find out the parameters which improve/damage reliability. This study has been evaluated using the DiskSim and SOYA simulators, and exploiting different configurations for a storage system running nine real workloads. In the simulation, the effect of five parameters on the improvement/damage of reliability is studied; these parameters are mapping P/E cycles with failure rate, disk failure rate, disk repair time, number of disks, and coding pattern of erasure codes. Simulation results show that in almost all cases, the effect of erasure codes on reliability improvement is on average 16 percent greater than their effect on reliability degradation.
引用
收藏
页码:435 / 446
页数:12
相关论文
共 37 条
[1]  
Agrawal N, 2008, P USENIX ANN TECHN C, P57, DOI DOI 10.1109/ISSCC.2012.6177101
[2]  
[Anonymous], [No title captured]
[3]  
[Anonymous], 2007, FIN OLTP APPL I O
[4]  
[Anonymous], 2009, P 42 ANN IEEE ACM IN, DOI DOI 10.1145/1669112.1669118
[5]  
[Anonymous], 2009, THESIS
[6]  
[Anonymous], 2010, BUILD SERV TRAC
[7]  
[Anonymous], 2015, 1 GIGABYTE HARD DRIV
[8]  
[Anonymous], 2010, EXCH TRAC
[9]   A design for high-performance flash disks [J].
Birrell, Andrew ;
Isard, Michael ;
Thacker, Chuck ;
Wobber, Ted .
Operating Systems Review (ACM), 2007, 41 (02) :88-93
[10]   EVENODD - AN EFFICIENT SCHEME FOR TOLERATING DOUBLE-DISK FAILURES IN RAID ARCHITECTURES [J].
BLAUM, M ;
BRADY, J ;
BRUCK, J ;
MENON, J .
IEEE TRANSACTIONS ON COMPUTERS, 1995, 44 (02) :192-202