Lateral forces during manipulation of a single C60 molecule on the Si(001)-2 x 1 surface

被引：11
作者：
Kageshima, M
Ogiso, H
Tokumoto, H
机构：
[1] Natl Inst Adv Ind Sci & Technol, Nanotechnol Res Inst, Tsukuba, Ibaraki 3058562, Japan
[2] Natl Inst Adv Ind Sci & Technol, Joint Res Ctr Atom Technol, Tsukuba, Ibaraki 3058562, Japan
[3] Natl Inst Adv Ind Sci & Technol, Inst Mech Syst Engn, Tsukuba, Ibaraki 3058562, Japan
来源：
SURFACE SCIENCE | 2002年 / 517卷 / 1-3期
关键词：
atomic force microscopy; scanning tunneling microscopy; friction; silicon; fullerenes;
D O I：
10.1016/S0039-6028(02)02059-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A method to measure lateral manipulation forces of a single molecule or a cluster was developed by combining scanning tunneling microscopy with a special lateral force sensor. The tunneling current and lateral force associated with manipulation of a single C-60 molecule on the Si(0 0 1)-2 x 1 surface were measured simultaneously during raster scanning of the probe. From the measured lateral force profiles the molecular hopping motion was analyzed and an estimate of the elastic energy stored in the molecule was determined. (C) 2002 Elsevier Science B.V. All rights reserved.
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收藏
页码：L557 / L562
页数：6
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