Chemical mechanical polishing of silicon wafers: Finite element analysis of wafer flatness

被引:0
|
作者
Zhang, X. H. [1 ]
Pei, Z. J. [1 ]
Fisher, Graham R. [1 ]
机构
[1] Kansas State Univ, Dept Ind & Mfg Syst, Manhattan, KS 66506 USA
来源
Manufacturing Engineering and Materials Handling, 2005 Pts A and B | 2005年 / 16卷
关键词
silicon wafer; FEA; waviness; flatness; contact-pressure; profile; pad;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Silicon is the primary semiconductor material used to fabricate integrated circuits. The quality of microchips depends directly on the quality of silicon wafers. A series of processes are required to manufacture the high-quality silicon wafers. Chemical mechanical polishing is a necessary step to achieve the required wafer flatness. In this paper, a finite element analysis has been conducted to study the effects of influencing factors (including Young's modulus and Poisson's ratio of the polishing pad, thickness of the pad, and polishing pressure) on the wafer flatness.
引用
收藏
页码:893 / 900
页数:8
相关论文
共 50 条
  • [1] Three-Dimensional Finite Element Analysis in Silicon Wafer Chemical Mechanical Polishing Process
    Wang X.
    Zhou Q.
    Lu Y.
    Ning Y.
    Zheng Y.
    Wang Y.
    Xiyou Jinshu/Chinese Journal of Rare Metals, 2023, 47 (09): : 1324 - 1330
  • [2] Wafer Flatness Modeling in Chemical Mechanical Polishing
    Zhao, Chaoyue
    Li, Jianyong
    Yi, Defu
    Li, Baozhen
    Cao, Jianguo
    JOURNAL OF ELECTRONIC MATERIALS, 2020, 49 (01) : 353 - 363
  • [3] Wafer Flatness Modeling in Chemical Mechanical Polishing
    Chaoyue Zhao
    Jianyong Li
    Defu Yi
    Baozhen Li
    Jianguo Cao
    Journal of Electronic Materials, 2020, 49 : 353 - 363
  • [4] Chemical mechanical polishing of silicon wafers
    Arimoto, Yoshihiro
    Shinku/Journal of the Vacuum Society of Japan, 1997, 40 (07): : 594 - 600
  • [5] AN ECONOMIC STUDY ON CHEMICAL MECHANICAL POLISHING OF SILICON WAFERS
    Baisie, Emmanuel A.
    Yang, Man
    Kaware, Ravindra
    Hooker, Maria
    Li, Z. C.
    PROCEEDINGS OF THE ASME INTERNATIONAL MANUFACTURING SCIENCE AND ENGINEERING CONFERENCE, VOL 1, 2009, : 691 - 697
  • [6] Wafer Non-uniformity Analysis during Chemical Mechanical Polishing Based on Finite Element Method
    Du, Shiwen
    Li, Yongtang
    Song, Jianjun
    Qi, Huiping
    MATERIALS SCIENCE AND ENGINEERING APPLICATIONS, PTS 1-3, 2011, 160-162 : 1518 - 1523
  • [7] CHEMICAL EFFECT MECHANISM IN CHEMICAL MECHANICAL POLISHING OF SILICON WAFER
    Wang, Xuejie
    Wang, Chenwei
    Li, Xing
    Jiang, Lijiao
    Lei, Shuangshuang
    CONFERENCE OF SCIENCE & TECHNOLOGY FOR INTEGRATED CIRCUITS, 2024 CSTIC, 2024,
  • [9] The effect of pad wear on the chemical mechanical polishing of silicon wafers
    Byrne, G
    Mullany, B
    Young, P
    CIRP ANNALS 1999 - MANUFACTURING TECHNOLOGY, 1999, : 143 - 146
  • [10] A pad roughness model for the analysis of lubrication in the chemical mechanical polishing of a silicon wafer
    Guo, Dongming
    Liu, Jingyuan
    Kang, Renke
    Jin, Zhuji
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2007, 22 (07) : 793 - 797