CHARACTERIZATION OF NANOCRYSTALLINE SnO2:F THIN FILMS PREPARED BY THE SPRAY PYROLYSIS TECHNIQUE

Nanocrystalline fluorine-doped tin oxide, SnO2:F, thin films were prepared by the spray pyrolysis (SP) technique on glass substrates. The films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray dispersive spectroscopy EDAX and transmittance measurements. X-ray diffraction patterns revealed the nanocrystalline nature of the films where the grain size was estimated based on the Sherrer formula. SEM micrographs showed that the films are uniform and totally covered with the material and they confirmed the nanocrystalline nature of the films. The absorbance was deduced from the transmittance measurements, and its first derivative was used to estimate the optical bandgap energy. Bandgaps larger than the bandgap of the bulk SnO2:F were obtained, indicating the presence of quantum dots. The hyperbolic band model was used to estimate the radii of the nanocrystallites. A comparison between the results of the different methods was performed.