Simulation Study of Node-State Transition Effect on the Single-Event Transient

被引：3
|
作者：
Liu Biwei [1 ]
Du Yankang [1 ]
Li Zhao [2 ]
Li Lei [3 ]
机构：
[1] Natl Univ Def Technol, Coll Comp, Changsha 410073, Hunan, Peoples R China
[2] China Natl Digital Switching Syst Engn & Technol, Zhengzhou 450002, Peoples R China
[3] Taiyuan Satellite Launch Ctr China, Taiyuan 036301, Peoples R China
来源：
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 2015年 / 15卷 / 03期
基金：
中国国家自然科学基金;
关键词：
Clock frequency; state transition; SET;
D O I：
10.1109/TDMR.2015.2462129
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Using 3-D technology computer-aided design numerical simulation, we comprehensively analyze the impact of node-state transition on a single-event transient (SET) pulse. Simulation results present that the SET pulsewidth is a function of the node current state and the state transition time. Based on the simulation results, we quantize the difference between the static SET injection and the dynamic SET injection.
引用
收藏
页码：467 / 471
页数：5
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