Reliability improvement experiments with degradation data

被引:60
作者
Joseph, VR [1 ]
Yu, IT
机构
[1] Georgia Inst Technol, Sch Ind & Syst Engn, Atlanta, GA 30332 USA
[2] Acad Sinica, Inst Stat Sci, Taipei 11529, Taiwan
关键词
Brownian motion; design of experiments; loss function; robust parameter design;
D O I
10.1109/TR.2005.858096
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Design of experiments is a useful tool for improving the quality & reliability of products. This article develops an integrated methodology for quality & reliability improvement when degradation data are available as the response in the experiments. The noise factors affecting the product are classified into two groups which led to a Brownian motion model for the degradation characteristic. A simple optimization procedure for finding the best control factor setting is developed using an integrated loss function. The methodology is illustrated with an application to a window wiper switch experiment.
引用
收藏
页码:149 / 157
页数:9
相关论文
共 12 条
[1]  
Chiao CH, 1996, QUAL RELIAB ENG INT, V12, P89, DOI 10.1002/(SICI)1099-1638(199603)12:2<89::AID-QRE997>3.0.CO
[2]  
2-D
[3]   MODELS FOR VARIABLE-STRESS ACCELERATED LIFE TESTING EXPERIMENTS BASED ON WIENER-PROCESSES AND THE INVERSE GAUSSIAN DISTRIBUTION [J].
DOKSUM, KA ;
HOYLAND, A .
TECHNOMETRICS, 1992, 34 (01) :74-82
[4]   Multi-state models: A review [J].
Hougaard, P .
LIFETIME DATA ANALYSIS, 1999, 5 (03) :239-264
[5]   Quality loss functions for nonnegative variables and their applications [J].
Joseph, VR .
JOURNAL OF QUALITY TECHNOLOGY, 2004, 36 (02) :129-138
[6]   USING DEGRADATION MEASURES TO ESTIMATE A TIME-TO-FAILURE DISTRIBUTION [J].
LU, CJ ;
MEEKER, WQ .
TECHNOMETRICS, 1993, 35 (02) :161-174
[7]   Statistical inference of a time-to-failure distribution derived from linear degradation data [J].
Lu, JC ;
Park, J ;
Yang, Q .
TECHNOMETRICS, 1997, 39 (04) :391-400
[8]  
Meeker W.Q., 2004, QUALITY TECHNOLOGY Q, V1, P1, DOI DOI 10.1080/16843703.2004.11673062
[9]   STATISTICAL TOOLS FOR THE RAPID DEVELOPMENT AND EVALUATION OF HIGH-RELIABILITY PRODUCTS [J].
MEEKER, WQ ;
HAMADA, M .
IEEE TRANSACTIONS ON RELIABILITY, 1995, 44 (02) :187-198
[10]  
TSENG ST, J QUALITY TECHNOLOGY