Layer-Wise Residual-Guided Feature Learning With Deep Learning Networks for Industrial Quality Prediction

被引:19
作者
Wang, Yalin [1 ]
Luo, Jiang [1 ]
Liu, Chenliang [1 ]
Yuan, Xiaofeng [1 ]
Wang, Kai [1 ]
Yang, Chunhua [1 ]
机构
[1] Cent South Univ, Sch Automat, Changsha 410083, Peoples R China
基金
中国国家自然科学基金;
关键词
Feature extraction; Data models; Data mining; Predictive models; Decoding; Training; Deep learning; quality prediction; residual information; stacked autoencoder (SAE); SOFT-SENSOR; NEURAL-NETWORK; REGRESSION;
D O I
10.1109/TIM.2022.3214611
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Deep learning has been widely used in quality prediction of industrial process data due to its powerful feature extraction capability. However, the limitation of deep learning hierarchical feature extraction manner will discard the valuable information related to quality variables in the original data, seriously impairing the reliability and usability of deep learning applications in the industry. The residuals, as the deviations of the actual values from the predicted values of the quality variables, could indirectly reflect this important information. To this end, residual information is introduced into the deep neural networks (NNs) to effectively guide the feature learning process of each layer. In this article, a novel layer-wise residual prediction network based on a stacked autoencoder (LR-SAE) is developed to obtain better feature representation from raw data and residual information related to quality variables. Based on this, the learned features are more reliable and representative, which could improve the performance of quality prediction. Finally, two industrial examples are applied to verify the effectiveness of the proposed method. Besides, the effects of the residual prediction of each network layer and the final quality prediction are carefully discussed on the proposed method. In two industrial applications, extensive experiments show that the prediction accuracy of the proposed method outperforms the traditional methods.
引用
收藏
页数:11
相关论文
共 31 条
[1]   Representation Learning: A Review and New Perspectives [J].
Bengio, Yoshua ;
Courville, Aaron ;
Vincent, Pascal .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2013, 35 (08) :1798-1828
[2]  
Brook R.J., 2018, Applied regression analysis and experimental design
[3]   Distributed Robust Process Monitoring Based on Optimized Denoising Autoencoder With Reinforcement Learning [J].
Chen, Shutian ;
Jiang, Qingchao .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 71
[4]   Soft Sensors Based on Adaptive Stacked Polymorphic Model for Silicon Content Prediction in Ironmaking Process [J].
Fang, Yijing ;
Jiang, Zhaohui ;
Pan, Dong ;
Gui, Weihua ;
Chen, Zhipeng .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 70
[5]   Dual Attention-Based Encoder-Decoder: A Customized Sequence-to-Sequence Learning for Soft Sensor Development [J].
Feng, Liangjun ;
Zhao, Chunhui ;
Sun, Youxian .
IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS, 2021, 32 (08) :3306-3317
[6]   Soft sensors for product quality monitoring in debutanizer distillation columns [J].
Fortuna, L ;
Graziani, S ;
Xibilia, MG .
CONTROL ENGINEERING PRACTICE, 2005, 13 (04) :499-508
[7]   Residual life, predictions from vibration-based degradation signals: A neural network approach [J].
Gebraeel, N ;
Lawley, M ;
Liu, R ;
Parmeshwaran, V .
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2004, 51 (03) :694-700
[8]   Novel Transformer Based on Gated Convolutional Neural Network for Dynamic Soft Sensor Modeling of Industrial Processes [J].
Geng, Zhiqiang ;
Chen, Zhiwei ;
Meng, Qingchao ;
Han, Yongming .
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2022, 18 (03) :1521-1529
[9]   ANN-based soft-sensor for real-time process monitoring and control of an industrial polymerization process [J].
Gonzaga, J. C. B. ;
Meleiro, L. A. C. ;
Kiang, C. ;
Maciel Filho, R. .
COMPUTERS & CHEMICAL ENGINEERING, 2009, 33 (01) :43-49
[10]   Design of inferential sensors in the process industry: A review of Bayesian methods [J].
Khatibisepehr, Shima ;
Huang, Biao ;
Khare, Swanand .
JOURNAL OF PROCESS CONTROL, 2013, 23 (10) :1575-1596