X-ray scattering from thin organic films and multilayers

被引:7
|
作者
Pietsch, U
Barberka, TA
Geue, T
Stommer, R
机构
[1] Institute of Solid State Physics, University of Potsdam, Potsdam
关键词
D O I
10.1007/BF03040998
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The real structure of LB-multilayers prepared with fatty-acid salts is dominated by finite-sized scattering aggregates. Their different length scales become visible using AFM. It shows that not the whole substrate is wetted by the film. The molecular order is restricted into domains. These micrometer domains are not homogeneous. They contain mesoscopic subdomains of different heights which vary in steps of double layers. Finally high-resolution AFM-maps display a nearly hexagonal arrangement of molecules within subgrains with a diameter of several 10 nm. This domain structure has to be taken into account when interpreting X-ray diffraction data. The size of the crystalline aggregates is obtained by means of X-ray grazing incidence diffraction. On the mesoscopic scale the domain size is determined by X-ray diffuse scattering experiments. Because Sinha's model fails for the present kind of multilayers, we used another approach for data analysis. The lateral correlation length caused by height fluctuations is estimated without knowledge of a definite correlation function. Additionally the mosaicity of the domain orientation can be taken into account.
引用
收藏
页码:393 / 402
页数:10
相关论文
共 50 条
  • [21] Diffuse X-ray scattering from GaN/SiC (0001) thin films
    Danis, S.
    Holy, V.
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2006, : 141 - 146
  • [22] X-ray scattering from polymer films
    Tolan, M
    Seeck, OH
    Wang, J
    Sinha, SK
    Refailovich, MH
    Sokolov, J
    PHYSICA B, 2000, 283 (1-3): : 22 - 26
  • [23] Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth
    Frank, C.
    Banerjee, R.
    Oettel, M.
    Gerlach, A.
    Novak, J.
    Santoro, G.
    Schreiber, F.
    PHYSICAL REVIEW B, 2014, 90 (20)
  • [24] Pair distribution functions of amorphous organic thin films from synchrotron X-ray scattering in transmission mode
    Shi, Chenyang
    Teerakapibal, Rattavut
    Yu, Lian
    Zhang, Geoff G. Z.
    IUCRJ, 2017, 4 : 555 - 559
  • [25] X-ray reflection from thin multilayers: symmetric patterns
    Karimov, P
    Harada, S
    Kawai, J
    SURFACE AND INTERFACE ANALYSIS, 2003, 35 (01) : 76 - 79
  • [26] Morphology of nanocermet thin films:: X-ray scattering study
    Hazra, S
    Gibaud, A
    Désert, A
    Sella, C
    Naudon, A
    PHYSICA B, 2000, 283 (1-3): : 97 - 102
  • [27] Dewetting of thin polymer films: an X-ray scattering study
    Muller-Buschbaum, P
    Stamm, M
    PHYSICA B, 1998, 248 : 229 - 237
  • [28] X-RAY AND NEUTRON-SCATTERING AT THIN-FILMS
    ZABEL, H
    FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYICS, 1990, 30 : 197 - 217
  • [29] X-ray scattering used to characterize surfaces and thin films
    Misture, Scott T.
    Glass Researcher, 1999, 9 (01):
  • [30] Small Angle X-ray Scattering in Thin Iron Films
    Chekadanov, A. S.
    Kuzmenko, A. P.
    Emelyanov, S. G.
    Chevyakov, L. M.
    Dobromyslov, M. B.
    JOURNAL OF NANO- AND ELECTRONIC PHYSICS, 2014, 6 (03)