Molecular dynamics simulation of the interaction between a mixed dislocation and a stacking fault tetrahedron

被引:35
作者
Lee, H. -J. [1 ]
Wirth, B. D. [1 ]
机构
[1] Univ Calif Berkeley, Dept Nucl Engn, Berkeley, CA 94720 USA
基金
美国国家科学基金会;
关键词
stacking fault tetrahedron; clear channel formation; mixed dislocation; dislocation interactions; irradiation effects; mechanical properties; microstructure change; molecular dynamic simulations; PLASTIC-FLOW LOCALIZATION; ATOMIC-SCALE; DEFECT INTERACTIONS; TENSILE PROPERTIES; FCC; DESTRUCTION; COPPER; LOOPS; MODEL;
D O I
10.1080/14786430902776954
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A high number-density of nanometer-sized stacking fault tetrahedra are commonly found during irradiation of low stacking fault energy metals. The stacking fault tetrahedra act as obstacles to dislocation motion leading to increased yield strength and decreased ductility. Thus, an improved understanding of the interaction between gliding dislocations and stacking fault tetrahedra are critical to reliably predict the mechanical properties of irradiated materials. Many studies have investigated the interaction of a screw or edge dislocation with a stacking fault tetrahedron (SFT). However, atomistic studies of a mixed dislocation interaction with an SFT are not available, even though mixed dislocations are the most common. In this paper, molecular dynamics simulation results of the interaction between a mixed dislocation and an SFT in face-centered cubic copper are presented. The interaction results in shearing, partial absorption, destabilization or simple bypass of the SFT, depending on the interaction geometry. However, the SFT was not completely annihilated, absorbed or collapsed during a single interaction with a mixed dislocation. These observations, combined with simulation results of edge or screw dislocations, suggest that defect-free channel formation in irradiated copper is not likely by a single dislocation sweeping or destruction process, but rather by a complex mix of multiple shearing, partial absorption and defect cluster transportation that ultimately reduces the size of stacking fault tetrahedra within a localized region.
引用
收藏
页码:821 / 841
页数:21
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