Optoelectronic Properties of Thermally Evaporated ZnO Films with Nanowalls on Glass Substrates

被引：6

作者：

Chen, Tse-Pu ^{[1
,2
]}

Hung, Fei-Yi ^{[3
]}

Chang, Sheng-Po ^{[1
,2
]}

Chang, Shoou-Jinn ^{[1
,2
]}

Hu, Zhan-Shuo ^{[4
]}

Chen, Kuan-Jen ^{[5
]}

机构：

[1] Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Ctr Micro Nano Sci & Technol, Inst Microelect, Tainan 701, Taiwan

[2] Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Ctr Micro Nano Sci & Technol, Dept Elect Engn, Tainan 701, Taiwan

[3] Natl Cheng Kung Univ, Ctr Micro Nano Sci & Engn, Inst Nanotechnol & Microsyst Engn, Dept Mat Sci & Engn, Tainan 701, Taiwan

[4] Natl Cheng Kung Univ, Ctr Micro Nano Sci & Technol, Inst Microelect, Tainan 701, Taiwan

[5] Natl Cheng Kung Univ, Instrument Ctr, Tainan 701, Taiwan

来源：

APPLIED PHYSICS EXPRESS | 2013年 / 6卷 / 04期

关键词：

ZINC-OXIDE; NANOWIRE; GROWTH; ARRAYS; NETWORKS;

D O I：

10.7567/APEX.6.045201

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Zinc oxide (ZnO) films with two-dimensional (2D) vertically aligned nanowalls, denoted by nanowalls-films, are successfully prepared on glass substrates at a low growth temperature of 450 degrees C without using metal catalysts. The morphology and optical properties of the nanowalls-film are characterized by scanning electron microscopy, X-ray diffraction analysis, transmission electron microscopy, energy dispersive X-ray spectroscopy, and photoluminescence measurement. The ZnO nanowalls-film show a strong UV emission and a preferred c-axis orientation with a hexagonal structure. The UV sensor measurement of the ZnO nanowalls-film shows a high sensitivity to UV light, rapid rise and decay times, and a good UV-to-visible rejection ratio. (C) 2013 The Japan Society of Applied Physics

引用

页数：4

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