Optoelectronic Properties of Thermally Evaporated ZnO Films with Nanowalls on Glass Substrates

被引：6
|
作者：
Chen, Tse-Pu [1 ,2 ]
Hung, Fei-Yi [3 ]
Chang, Sheng-Po [1 ,2 ]
Chang, Shoou-Jinn [1 ,2 ]
Hu, Zhan-Shuo [4 ]
Chen, Kuan-Jen [5 ]
机构：
[1] Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Ctr Micro Nano Sci & Technol, Inst Microelect, Tainan 701, Taiwan
[2] Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Ctr Micro Nano Sci & Technol, Dept Elect Engn, Tainan 701, Taiwan
[3] Natl Cheng Kung Univ, Ctr Micro Nano Sci & Engn, Inst Nanotechnol & Microsyst Engn, Dept Mat Sci & Engn, Tainan 701, Taiwan
[4] Natl Cheng Kung Univ, Ctr Micro Nano Sci & Technol, Inst Microelect, Tainan 701, Taiwan
[5] Natl Cheng Kung Univ, Instrument Ctr, Tainan 701, Taiwan
来源：
APPLIED PHYSICS EXPRESS | 2013年 / 6卷 / 04期
关键词：
ZINC-OXIDE; NANOWIRE; GROWTH; ARRAYS; NETWORKS;
D O I：
10.7567/APEX.6.045201
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Zinc oxide (ZnO) films with two-dimensional (2D) vertically aligned nanowalls, denoted by nanowalls-films, are successfully prepared on glass substrates at a low growth temperature of 450 degrees C without using metal catalysts. The morphology and optical properties of the nanowalls-film are characterized by scanning electron microscopy, X-ray diffraction analysis, transmission electron microscopy, energy dispersive X-ray spectroscopy, and photoluminescence measurement. The ZnO nanowalls-film show a strong UV emission and a preferred c-axis orientation with a hexagonal structure. The UV sensor measurement of the ZnO nanowalls-film shows a high sensitivity to UV light, rapid rise and decay times, and a good UV-to-visible rejection ratio. (C) 2013 The Japan Society of Applied Physics
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页数：4
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