Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy

被引：23

作者：

Balantekin, M ^{[1
]}

Atalar, A ^{[1
]}

机构：

[1] Bilkent Univ, Elect Engn Dept, TR-06800 Ankara, Turkey

来源：

APPLIED PHYSICS LETTERS | 2005年 / 87卷 / 24期

关键词：

D O I：

10.1063/1.2147708

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlinear tip-sample interaction force. The higher harmonics contain important information about the materials' nanomechanical properties. These harmonics can be significantly enhanced by driving the cantilever close to a submultiple of its resonant frequency. We present the results of enhanced higher-harmonic imaging experiments on several samples. The results indicate that enhanced higher harmonics can be utilized effectively for both material characterization and surface roughness analysis with a high signal-to-noise ratio.

引用

页码：1 / 3

页数：3

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