机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Columbia Univ, Dept Elect Engn, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Lui, Chun Hung
[1
,2
]
Liu, Li
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Chem, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Liu, Li
[3
]
Mak, Kin Fai
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Columbia Univ, Dept Elect Engn, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Mak, Kin Fai
[1
,2
]
Flynn, George W.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Chem, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Flynn, George W.
[3
]
Heinz, Tony F.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Columbia Univ, Dept Elect Engn, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Heinz, Tony F.
[1
,2
]
机构:
[1] Columbia Univ, Dept Phys, New York, NY 10027 USA
[2] Columbia Univ, Dept Elect Engn, New York, NY 10027 USA
[3] Columbia Univ, Dept Chem, New York, NY 10027 USA
Graphene, a single atomic layer of carbon connected by sp(2) hybridized bonds, has attracted intense scientific interest since its recent discovery(1). Much of the research on graphene has been directed towards exploration of its novel electronic properties, but the structural aspects of this model two-dimensional system are also of great interest and importance. In particular, microscopic corrugations have been observed on all suspended(2) and supported(3-8) graphene sheets studied so far. This rippling has been invoked to explain the thermodynamic stability of free-standing graphene sheets(9). Many distinctive electronic(10-12) and chemical(13-15) properties of graphene have been attributed to the presence of ripples, which are also predicted to give rise to new physical phenomena(16-26) that would be absent in a planar two-dimensional material. Direct experimental study of such novel ripple physics has, however, been hindered by the lack of flat graphene layers. Here we demonstrate the fabrication of graphene monolayers that are flat down to the atomic level. These samples are produced by deposition on the atomically flat terraces of cleaved mica surfaces. The apparent height variation in the graphene layers observed by high-resolution atomic force microscopy (AFM) is less than 25 picometres, indicating the suppression of any existing intrinsic ripples in graphene. The availability of such ultraflat samples will permit rigorous testing of the impact of ripples on various physical and chemical properties of graphene.
机构:
Columbia Univ, Dept Chem, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Ryu, Sunmin
Han, Melinda Y.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Appl Phys & Appl Math, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Han, Melinda Y.
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机构:
Maultzsch, Janina
Heinz, Tony F.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Columbia Univ, Dept Elect Engn, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Heinz, Tony F.
Kim, Philip
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Kim, Philip
Steigerwald, Michael L.
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h-index: 0
机构:Columbia Univ, Dept Chem, New York, NY 10027 USA
Steigerwald, Michael L.
Brus, Louis E.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Chem, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
机构:
Columbia Univ, Dept Chem, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Ryu, Sunmin
Han, Melinda Y.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Appl Phys & Appl Math, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Han, Melinda Y.
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h-index:
机构:
Maultzsch, Janina
Heinz, Tony F.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Columbia Univ, Dept Elect Engn, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Heinz, Tony F.
Kim, Philip
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Kim, Philip
Steigerwald, Michael L.
论文数: 0引用数: 0
h-index: 0
机构:Columbia Univ, Dept Chem, New York, NY 10027 USA
Steigerwald, Michael L.
Brus, Louis E.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Chem, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA